摘要:
The invention relates to a device for testing the material of test objects (15) by means of X-ray radiation, comprising an X-ray device (20) which comprises an X-ray source (12) for irradiating a test object (15) maintained in a test position and an X-ray detector (13) designed as a line detector, and an electronic control element (38) which is designed to control the X-ray device (20). During X-ray testing, the test object (15) and the X-ray device can be rotated in relation to each other only about an essentially vertical rotational axis (R). The claimed device is characterised in that the X-ray detector (13) comprises at least two detection sections (13A, 13B,...) which are designed to detect the test object over a complete radial cross-section (52A, 52B,...).