摘要:
A total reflection measurement method using a total reflection spectrometer 1 is a total reflection measurement method comprising arranging an object to be measured on a total reflection surface 31c of an internal total reflection prism 31 and measuring an optical constant concerning the object 34 according to a terahertz wave totally reflected by the total reflection surface 31c after passing the prism 31, wherein a liquid 50 incapable of dissolving the object 34 is interposed at least between the total reflection surface 31c and the object 34. A force such as an adhesion force acting between the liquid 50 and the object 34 can place the object 34 closer to the total reflection surface 31c, thereby stably generating an interaction between an evanescent component and the object 34.
摘要:
Probe light pulses output from a light source are input to an optical effect unit after the beam diameter thereof is changed by a beam diameter changing optical system, the pulse front thereof is tilted by a pulse front tilting unit, and the beam diameter thereof is adjusted by a beam diameter adjusting optical system. To the optical effect unit, probe light pulses output from the beam diameter adjusting optical system are input, and an electromagnetic wave being an object to be detected is also input. Optical characteristics of the optical effect unit change due to propagation of the electromagnetic wave, and probe light pulses affected by the change in optical characteristics are output from the optical effect unit. The probe light pulses output from the optical effect unit are detected by a photodetector. Accordingly, an electromagnetic wave detection device which allows easily setting each of the pulse front tilt angle and beam diameter of probe light pulses to be input to its optical effect unit to appropriate values is realized.
摘要:
In a terahertz-wave spectrometer 1, a spectroscopic prism 31 is provided with a prism part 52 slidable with respect to a main part 51 thereof. Along the sliding direction, an arrangement surface 31c in an upper face of the prism part 52 is provided with a plurality of arrangement regions K to be arranged with objects to be measured 34. Therefore, after completing the measurement of optical constants for one object 34, the prism part 52 is slid, so as to shift the next object 34 onto an optical path of a terahertz wave T, whereby a plurality of objects 34 can be measured smoothly without cleaning the arrangement surface 31c.
摘要:
By mating a main part 51 with a first prism part 61 or second prism part, a terahertz-wave spectrometer 1 can easily switch between optical paths of a terahertz wave T propagating within a spectroscopic prism 31. When the main part 51 mates with the first prism part 61, the terahertz wave T incident on an entrance surface 31a passes through a depression 51a, so as to be reflected by an arrangement part 31c, whereby reflection spectrometry can be performed. When the main part 51 mates with the second prism part 71, the terahertz wave T incident on the entrance surface 31a is refracted by the depression 51a, so as to pass through an object 34 to be measured within a groove 71a, whereby transmission spectrometry can be preformed.
摘要:
A wave plate 1 comprising: a prism member 2 having an entrance surface 3 for receiving a terahertz wave T, and an exit surface 4 for emitting the terahertz wave T received by the entrance surface 3; wherein the prism member 2 is constituted by a plurality of waveguide regions having: a partial entrance surface 13 for receiving a part of the terahertz wave T, a plurality of total reflection surfaces 15 for totally reflecting the terahertz wave T from the partial entrance surface 13, and a partial exit surface 14 for emitting the terahertz wave T totally reflected from the total reflection surfaces 15; and each of the partial entrance surfaces 13 combine to constitute the entrance surface 3 of the prism member 2, and each of the partial exit surfaces 14 combine to constitute the exit surface 4 of the prism member 2, by stacking waveguide regions.