摘要:
An electric field measuring apparatus can guide, with a predetermined optical path length, pulse light with a short pulse width output from a laser light source to an object to be measured or an electric field sensor without expansion of the pulse width caused by wavelength dispersion, thereby enabling electric field measurement with a high time resolution. A laser luminous flux incident on an input end of an input optical system is divided by a light dividing section into probe light and pumping light. After being transmitted through a light delaying device, the probe light is guided through an articulated light guiding path of reflecting mirror type in which a plurality of tubular light guiding sections, each of which has a light guiding path therewithin made of a medium having no wavelength dispersion with a bending point at which a reflecting mirror is disposed, are rotatably cascaded to each other such that their light guiding paths coincide with each other by way of joint sections, so as to be supplied to a microscope unit. On the other hand, the pumping light is guided through an articulated probe light guiding path of reflecting . mirror type so as to irradiate an object to be measured. Also, a CCD camera is united with the exit end of an articulated reflecting mirror type light guiding path, allowing the positioning of the point irradiated with the pumping light.
摘要:
A total reflection measurement method using a total reflection spectrometer 1 is a total reflection measurement method comprising arranging an object to be measured on a total reflection surface 31c of an internal total reflection prism 31 and measuring an optical constant concerning the object 34 according to a terahertz wave totally reflected by the total reflection surface 31c after passing the prism 31, wherein a liquid 50 incapable of dissolving the object 34 is interposed at least between the total reflection surface 31c and the object 34. A force such as an adhesion force acting between the liquid 50 and the object 34 can place the object 34 closer to the total reflection surface 31c, thereby stably generating an interaction between an evanescent component and the object 34.
摘要:
Probe light pulses output from a light source are input to an optical effect unit after the beam diameter thereof is changed by a beam diameter changing optical system, the pulse front thereof is tilted by a pulse front tilting unit, and the beam diameter thereof is adjusted by a beam diameter adjusting optical system. To the optical effect unit, probe light pulses output from the beam diameter adjusting optical system are input, and an electromagnetic wave being an object to be detected is also input. Optical characteristics of the optical effect unit change due to propagation of the electromagnetic wave, and probe light pulses affected by the change in optical characteristics are output from the optical effect unit. The probe light pulses output from the optical effect unit are detected by a photodetector. Accordingly, an electromagnetic wave detection device which allows easily setting each of the pulse front tilt angle and beam diameter of probe light pulses to be input to its optical effect unit to appropriate values is realized.
摘要:
The present invention provides an optical amplifying device which can be easily downsized, increased in output, and stabilized. An optical amplifying device 1A includes an optical amplifier 10A and an energy supplier 30. The optical amplifier 10A includes an optical amplifying medium 11 and a transparent medium 12. The energy supplier 30 supplies excitation energy (for example, excitation light) to the optical amplifying medium 11. The optical amplifying medium 11 is supplied with the excitation light to amplify light and output it. To-be-amplified light passes through the transparent medium 12 in the optical amplifying medium 11 a plurality of times. The transparent medium 12 can propagate the to-be-amplified light, for example, zigzag inside.
摘要:
In a terahertz-wave spectrometer 1, a spectroscopic prism 31 is provided with a prism part 52 slidable with respect to a main part 51 thereof. Along the sliding direction, an arrangement surface 31c in an upper face of the prism part 52 is provided with a plurality of arrangement regions K to be arranged with objects to be measured 34. Therefore, after completing the measurement of optical constants for one object 34, the prism part 52 is slid, so as to shift the next object 34 onto an optical path of a terahertz wave T, whereby a plurality of objects 34 can be measured smoothly without cleaning the arrangement surface 31c.
摘要:
By mating a main part 51 with a first prism part 61 or second prism part, a terahertz-wave spectrometer 1 can easily switch between optical paths of a terahertz wave T propagating within a spectroscopic prism 31. When the main part 51 mates with the first prism part 61, the terahertz wave T incident on an entrance surface 31a passes through a depression 51a, so as to be reflected by an arrangement part 31c, whereby reflection spectrometry can be performed. When the main part 51 mates with the second prism part 71, the terahertz wave T incident on the entrance surface 31a is refracted by the depression 51a, so as to pass through an object 34 to be measured within a groove 71a, whereby transmission spectrometry can be preformed.
摘要:
A target for generating deuteron which comprises a base film comprising a halogen-containing organic compound as the main component thereof and, provided thereon, an upper film comprising a deuterated organic compound as the main component thereof; and an target apparatus for generating deuteron comprising the target. The target has a structure capable of generating deueron with good efficiency.
摘要:
An optical delay apparatus that regularly alternately outputs beams having mutually different delays on one optical axis and that can variably set a delay amount of at least one beam. A motor 112 rotation-drives a rotating plate 111 in which reflective portions and transmissive portions are formed regularly alternately in the circumferential direction. When an incident beam I0 is incident to a reflective portion of the rotating plate 111, it is reflected to generate a beam I1. When the incident beam I0 is incident to a transmissive portion of the rotating plate 111, a beam I2 transmitted is reflected by a reflector 120 to become a beam I3, and the beam I3 is again transmitted by the transmissive portion of the rotating plate 111. This beam I3 has a delay different from that of the beam I1, and the beam I3 and the beam I1 advance regularly alternately in the same direction and on the same optical axis. Further, the reflector 120 is arranged as movable by a moving stage 130, and the delay amount of the beam I3 changes with movement of the reflector.