Means for measuring the electric field
    1.
    发明公开
    Means for measuring the electric field 失效
    装置,用于测量电场

    公开(公告)号:EP0784206A3

    公开(公告)日:1998-07-08

    申请号:EP97300070

    申请日:1997-01-08

    CPC分类号: G01R29/0885

    摘要: An electric field measuring apparatus can guide, with a predetermined optical path length, pulse light with a short pulse width output from a laser light source to an object to be measured or an electric field sensor without expansion of the pulse width caused by wavelength dispersion, thereby enabling electric field measurement with a high time resolution. A laser luminous flux incident on an input end of an input optical system is divided by a light dividing section into probe light and pumping light. After being transmitted through a light delaying device, the probe light is guided through an articulated light guiding path of reflecting mirror type in which a plurality of tubular light guiding sections, each of which has a light guiding path therewithin made of a medium having no wavelength dispersion with a bending point at which a reflecting mirror is disposed, are rotatably cascaded to each other such that their light guiding paths coincide with each other by way of joint sections, so as to be supplied to a microscope unit. On the other hand, the pumping light is guided through an articulated probe light guiding path of reflecting . mirror type so as to irradiate an object to be measured. Also, a CCD camera is united with the exit end of an articulated reflecting mirror type light guiding path, allowing the positioning of the point irradiated with the pumping light.

    TOTAL REFLECTION SPECTROSCOPIC MEASUREMENT METHOD
    2.
    发明公开
    TOTAL REFLECTION SPECTROSCOPIC MEASUREMENT METHOD 审中-公开
    SPEKTROSKOPISCHES GESAMTREFLEXIONS-MESSVERFAHREN

    公开(公告)号:EP2690426A4

    公开(公告)日:2014-09-03

    申请号:EP12760839

    申请日:2012-02-28

    摘要: A total reflection measurement method using a total reflection spectrometer 1 is a total reflection measurement method comprising arranging an object to be measured on a total reflection surface 31c of an internal total reflection prism 31 and measuring an optical constant concerning the object 34 according to a terahertz wave totally reflected by the total reflection surface 31c after passing the prism 31, wherein a liquid 50 incapable of dissolving the object 34 is interposed at least between the total reflection surface 31c and the object 34. A force such as an adhesion force acting between the liquid 50 and the object 34 can place the object 34 closer to the total reflection surface 31c, thereby stably generating an interaction between an evanescent component and the object 34.

    摘要翻译: 使用全反射光谱仪1的全反射测量方法是全反射测量方法,包括在内部全反射棱镜31的全反射表面31c上布置被测物体,并根据太赫兹测量关于物体34的光常数 在通过棱镜31之后,全反射面31c全反射的波形,其中不能溶解物体34的液体50至少插入在全反射面31c和物体34之间。诸如作用在物体34之间的粘附力的力 液体50和物体34可以使物体34更靠近全反射面31c,从而稳定地产生ev逝部件与物体34之间的相互作用。

    ELECTROMAGNETIC WAVE DETECTION DEVICE
    3.
    发明公开

    公开(公告)号:EP2554974A4

    公开(公告)日:2018-01-17

    申请号:EP11762336

    申请日:2011-02-01

    摘要: Probe light pulses output from a light source are input to an optical effect unit after the beam diameter thereof is changed by a beam diameter changing optical system, the pulse front thereof is tilted by a pulse front tilting unit, and the beam diameter thereof is adjusted by a beam diameter adjusting optical system. To the optical effect unit, probe light pulses output from the beam diameter adjusting optical system are input, and an electromagnetic wave being an object to be detected is also input. Optical characteristics of the optical effect unit change due to propagation of the electromagnetic wave, and probe light pulses affected by the change in optical characteristics are output from the optical effect unit. The probe light pulses output from the optical effect unit are detected by a photodetector. Accordingly, an electromagnetic wave detection device which allows easily setting each of the pulse front tilt angle and beam diameter of probe light pulses to be input to its optical effect unit to appropriate values is realized.

    TERAHERTZ-WAVE SPECTROMETER
    6.
    发明公开
    TERAHERTZ-WAVE SPECTROMETER 审中-公开
    太赫兹波谱仪

    公开(公告)号:EP2693200A4

    公开(公告)日:2014-09-17

    申请号:EP12764439

    申请日:2012-02-21

    IPC分类号: G01N21/35

    CPC分类号: G01J3/42 G01N21/3581

    摘要: In a terahertz-wave spectrometer 1, a spectroscopic prism 31 is provided with a prism part 52 slidable with respect to a main part 51 thereof. Along the sliding direction, an arrangement surface 31c in an upper face of the prism part 52 is provided with a plurality of arrangement regions K to be arranged with objects to be measured 34. Therefore, after completing the measurement of optical constants for one object 34, the prism part 52 is slid, so as to shift the next object 34 onto an optical path of a terahertz wave T, whereby a plurality of objects 34 can be measured smoothly without cleaning the arrangement surface 31c.

    摘要翻译: 在太赫兹波谱仪1中,分光棱镜31设置有可相对于其主要部分51滑动的棱镜部分52。 沿着滑动方向,棱镜部52的上表面的配置面31c设置有多个配置区域K,配置有被测量对象34 34.因此,在完成对一个物体34的光学常数的测量之后 棱镜部分52滑动,以便将下一个物体34移动到太赫兹波T的光路上,从而能够平滑地测量多个物体34,而不需要清洁布置表面31c。

    TERAHERTZ-WAVE SPECTROMETER AND PRISM MEMBER
    7.
    发明公开
    TERAHERTZ-WAVE SPECTROMETER AND PRISM MEMBER 有权
    太赫兹波光谱仪和棱镜要素

    公开(公告)号:EP2693199A4

    公开(公告)日:2014-09-10

    申请号:EP12763373

    申请日:2012-02-21

    IPC分类号: G01N21/35

    摘要: By mating a main part 51 with a first prism part 61 or second prism part, a terahertz-wave spectrometer 1 can easily switch between optical paths of a terahertz wave T propagating within a spectroscopic prism 31. When the main part 51 mates with the first prism part 61, the terahertz wave T incident on an entrance surface 31a passes through a depression 51a, so as to be reflected by an arrangement part 31c, whereby reflection spectrometry can be performed. When the main part 51 mates with the second prism part 71, the terahertz wave T incident on the entrance surface 31a is refracted by the depression 51a, so as to pass through an object 34 to be measured within a groove 71a, whereby transmission spectrometry can be preformed.

    Optical delay apparatus
    9.
    发明公开
    Optical delay apparatus 失效
    OptischesZeitverzögerungsgerät

    公开(公告)号:EP0784222A3

    公开(公告)日:1998-08-12

    申请号:EP97300071

    申请日:1997-01-08

    IPC分类号: G02B26/04 G02B27/10

    摘要: An optical delay apparatus that regularly alternately outputs beams having mutually different delays on one optical axis and that can variably set a delay amount of at least one beam. A motor 112 rotation-drives a rotating plate 111 in which reflective portions and transmissive portions are formed regularly alternately in the circumferential direction. When an incident beam I0 is incident to a reflective portion of the rotating plate 111, it is reflected to generate a beam I1. When the incident beam I0 is incident to a transmissive portion of the rotating plate 111, a beam I2 transmitted is reflected by a reflector 120 to become a beam I3, and the beam I3 is again transmitted by the transmissive portion of the rotating plate 111. This beam I3 has a delay different from that of the beam I1, and the beam I3 and the beam I1 advance regularly alternately in the same direction and on the same optical axis. Further, the reflector 120 is arranged as movable by a moving stage 130, and the delay amount of the beam I3 changes with movement of the reflector.

    摘要翻译: 一种光学延迟装置,其规则地交替地输出在一个光轴上具有相互不同的延迟的光束,并且可以可变地设置至少一个光束的延迟量。 电动机112旋转驱动旋转板111,其中反射部分和透射部分在周向上规则地交替地形成。 当入射光束I0入射到旋转板111的反射部分时,其被反射以产生光束I1。 当入射光束I0入射到旋转板111的透射部分时,透射的光束I2被反射器120反射成为光束I3,并且光束I3再次由旋转板111的透射部分透射。 该光束I3具有与光束I1不同的延迟,并且光束I3和光束I1在相同的方向和相同的光轴上交替地前进。 此外,反射器120被移动台130布置成可移动,并且光束I3的延迟量随着反射器的移动而改变。