摘要:
In a composite magnetic head comprising a magnetoresistive read head (10) including a magnetic thin film having a magnetoresistive effect and soft magnetic members interposing the soft magnetic film between them through a non-magnetic insulation layer, an induction type write head (11) including poles formed in a moving direction of a medium and a conductor crossing the poles, and disposed in the proximity of the magnetoresistive head, and a substrate (5) supporting these heads, the present disclosure describes a composite magnetic head characterized in that part of a floating surface inclusive of the magnetic head constituent members has recesses (7, 8) and the read/write operations to and from the medium are effected by the portion interposed by these recesses.
摘要:
In a composite magnetic head comprising a magnetoresistive read head (10) including a magnetic thin film having a magnetoresistive effect and soft magnetic members interposing the soft magnetic film between them through a non-magnetic insulation layer, an induction type write head (11) including poles formed in a moving direction of a medium and a conductor crossing the poles, and disposed in the proximity of the magnetoresistive head, and a substrate (5) supporting these heads, the present disclosure describes a composite magnetic head characterized in that part of a floating surface inclusive of the magnetic head constituent members has recesses (7, 8) and the read/write operations to and from the medium are effected by the portion interposed by these recesses.
摘要:
In an optical system, the total optical path length from the emitter tip of an ion source (1) to the surface of a sample (10) is in the range of from 300 to 450 mm, the distance from the ion source to the centre of a condenser lens (2) is in the range of from 15 to 45 mm, and the distance from the centre of an objective lens (8) to the sample is in the range of from 10 to 40 mm. The optical system is installed in a focused ion beam apparatus in order to realise milling of fine elements to high accuracy at high speed, image observation with high resolution in failure analysis and process evaluation of fine elements such as semiconductors.
摘要:
In an optical system, the total optical path length from the emitter tip of an ion source (1) to the surface of a sample (10) is in the range of from 300 to 450 mm, the distance from the ion source to the centre of a condenser lens (2) is in the range of from 15 to 45 mm, and the distance from the centre of an objective lens (8) to the sample is in the range of from 10 to 40 mm. The optical system is installed in a focused ion beam apparatus in order to realise milling of fine elements to high accuracy at high speed, image observation with high resolution in failure analysis and process evaluation of fine elements such as semiconductors.