公开(公告)号：EP2570814A4

公开(公告)日：2018-01-03

申请号：EP11780439

申请日：2011-03-25

申请人： HITACHI HIGH-TECHNOLOGIES CORP

发明人： TAJIMA YOSHIYUKI ,  NOGUCHI TAKASHI ,  YANO SHIGERU ,  KAMOSHIDA KOJI

IPC分类号： G01N35/02 ,  G01N35/00 ,  G01N35/04 ,  G01N35/10 ,  G06Q10/06 ,  G06Q50/22

CPC分类号： G06Q10/063114 ,  G01N35/0092 ,  G01N35/0095 ,  G01N2035/0462 ,  G01N2035/1032 ,  G06Q50/22

摘要： Precise prediction of the state of congestion in an automatic analysis system and adjustment of timings and the order of take-in and take-out of specimens in each device prevent increase in TATs of urgent specimens. A device management server for providing instructions for take-in and take-out of specimens in each device, includes: a tracking unit which determines the current position of each specimen after input by using signals of sensors; a simulation unit which estimates the staying time of each specimen in one of regions by simulating the operation of each device in accordance with a take in/out schedule plan assuming an initial state in which each specimen is at the current position; and a take in/out scheduling unit which produces an initial take in/out schedule plan for preferentially taking in and taking out urgent specimens, causes the simulation unit to perform a simulation, and corrects, in the initial take in/out schedule plan, the timings or order of take-in and take-out of one or more other specimens so that each of the staying times in one of the regions do not exceed a corresponding allowable staying time in the region.

公开(公告)号：EP2437068A4

公开(公告)日：2017-11-22

申请号：EP10780398

申请日：2010-04-28

申请人： HITACHI HIGH-TECHNOLOGIES CORP

发明人： NOGUCHI TAKASHI ,  TAJIMA YOSHIYUKI ,  KAMOSHIDA KOJI ,  ISHII NAOMI

IPC分类号： G01N35/00 ,  G01N35/02

CPC分类号： G01N35/02 ,  G01N35/00 ,  G01N35/00732 ,  G01N35/0092 ,  G01N35/0095

摘要： There is provided a sample test system which can execute a prior process for a specific sample in consideration of priorities and process progresses of a plurality of samples processed in the sample test system. The sample test system includes a sample-test-device management server 101, when a specific-sample prior process request containing a specific sample ID and a prior-process-request level identification code is accepted from a sample access system 108, which selects a specific-sample prior-process-policy determination table based on the prior-process-request level identification code attached to the specific-sample prior process request, which determines a specific-sample prior process policy based on the specific-sample prior-process-policy determination table and a process state of the sample, which specifies a sample ID regarding the specific sample ID, and which transmits the specific-sample prior process policy to a sample-test-device group 119.