GAS ANALYZER
    1.
    发明公开
    GAS ANALYZER 有权
    气体分析仪

    公开(公告)号:EP2743680A4

    公开(公告)日:2015-04-08

    申请号:EP12823502

    申请日:2012-08-10

    Applicant: HORIBA LTD

    Abstract: A gas analysis apparatus (100) includes: one light emitting unit (2) arranged outside a gas flue wall (1a); a first reflector (3) that reflects measurement light that has been emitted from the light emitting unit (2) and has been transmitted through the sample gas (Sg); a light receiving unit (4) arranged outside the gas flue wall (1a) that receives the measurement light that has been reflected by the first reflector (3); a second reflector (5) arranged outside the gas flue wall (1a) that reflects the measurement light toward the light receiving unit (4); a known substance containing unit (6) arranged in a space along the light path between the light emitting unit (2) and the second reflector (5) that contains the known substances, a computing unit (7) that analyzes sample gas (Sg) by allowing the measurement light emitted from the light emitting unit (2) to be reflected by the first reflector (3) and performs correction or calibration of the gas analysis apparatus (100) using the known substances by allowing the measurement light emitted from light emitting unit (2) to be reflected by the second reflector (5); and a switching unit (8) arranged outside the gas flue wall (1a) that removes the second reflector (5) from the light path when performing the component concentration and places the second reflector (5) into the light path when performing the correction or calibration.

    MEASURING UNIT AND GAS ANALYZER
    2.
    发明公开
    MEASURING UNIT AND GAS ANALYZER 审中-公开
    测量单元和分析单元

    公开(公告)号:EP2711688A4

    公开(公告)日:2014-10-29

    申请号:EP12789485

    申请日:2012-05-17

    Applicant: HORIBA LTD

    Abstract: A measurement unit (1) used in an analyzing apparatus for measuring concentrations of component gases in a sample gas comprises an light emitting unit (21) configured to emit a measurement light to the sample gas, a light receiving unit (24) configured to receive the measurement light on a light receiving plane, a purge air introducing unit (14) configured to introduce a purge air into a vicinity of at least one of the light emitting unit (21) and/or the light receiving unit (24), and a condensing lens (23) arranged in an optical path of the measurement light from the light emitting unit (21) to the light receiving unit (24), the condensing lens (23) being configured to condense the measurement light within the light receiving plane of the light receiving unit (24), a propagation path of the measurement light being varied by a thermal lens effect caused by a temperature difference between the sample gas and the purge air.

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