公开(公告)号：EP4257966A3

公开(公告)日：2023-11-29

申请号：EP23189772.9

申请日：2016-08-26

Applicant: Hamamatsu Photonics K.K.

Inventor： NAITO, Yasuhide ,  KOTANI, Masahiro ,  OHMURA, Takayuki

IPC: H01J49/04 ,  H01J49/00 ,  G01N27/623

Abstract: A surface-assisted laser desorption/ionization method according to an aspect includes: a first process of preparing a sample support (2) having a substrate (21) in which a plurality of through-holes (S) passing from one surface (21a) thereof to the other surface (21b) thereof are provided and a conductive layer (23) that covers at least the one surface (21a); a second process of placing a sample (10) on a sample stage (1) and arranging the sample support (2) on the sample (10) such that the other surface (21b) faces the sample (10); and a third process of applying a laser beam (L) to the one surface (21a) and ionizing the sample (10) moved from the other surface (21b) side to the one surface (21a) side via the through-holes (S) due to a capillary phenomenon.

公开(公告)号：EP4257966A2

公开(公告)日：2023-10-11

申请号：EP23189772.9

申请日：2016-08-26

Applicant: Hamamatsu Photonics K.K.

Inventor： NAITO, Yasuhide ,  KOTANI, Masahiro ,  OHMURA, Takayuki

IPC: G01N27/623

Abstract: A surface-assisted laser desorption/ionization method according to an aspect includes: a first process of preparing a sample support (2) having a substrate (21) in which a plurality of through-holes (S) passing from one surface (21a) thereof to the other surface (21b) thereof are provided and a conductive layer (23) that covers at least the one surface (21a); a second process of placing a sample (10) on a sample stage (1) and arranging the sample support (2) on the sample (10) such that the other surface (21b) faces the sample (10); and a third process of applying a laser beam (L) to the one surface (21a) and ionizing the sample (10) moved from the other surface (21b) side to the one surface (21a) side via the through-holes (S) due to a capillary phenomenon.

公开(公告)号：EP3214437B1

公开(公告)日：2020-02-26

申请号：EP16841742.6

申请日：2016-08-26

Applicant: Hamamatsu Photonics K.K.

Inventor： NAITO, Yasuhide ,  KOTANI, Masahiro ,  OHMURA, Takayuki

IPC: H01J49/04

公开(公告)号：EP3214436B1

公开(公告)日：2020-03-11

申请号：EP16841741.8

申请日：2016-08-26

Applicant: Hamamatsu Photonics K.K.

Inventor： NAITO, Yasuhide ,  KOTANI, Masahiro ,  OHMURA, Takayuki

IPC: H01J49/04 ,  G01N27/62

公开(公告)号：EP4279898A1

公开(公告)日：2023-11-22

申请号：EP21926748.1

申请日：2021-12-06

Applicant: Hamamatsu Photonics K.K.

Inventor： HIRAO, Tsuyoshi ,  NAITO, Yasuhide ,  KOSUGI, Norimasa

IPC: G01N1/28 ,  G01N27/62 ,  H01J49/00 ,  H01J49/02 ,  H01J49/06 ,  H01J49/14 ,  H01J49/16 ,  H01J49/40

Abstract: The mass spectrometer includes a sample stage, an irradiation unit that irradiates the sample with an energy beam and ionizes a component of the sample while maintaining positional information of the sample in a region irradiated with the energy beam, an extraction electrode that extracts the ionized sample from the surface of the sample by a potential difference from the sample stage, an MCP that emits electrons in accordance with the ionized sample, an imaging part that acquires an image based on the electrons emitted by the MCP, and a control unit that controls operations of the irradiation unit, the extraction electrode, and the imaging part. The control unit changes the potential of the extraction electrode at a timing in accordance with the detection target component after the irradiation of the energy beam by the irradiation unit, and causes the imaging part to acquire an image as an analysis target in a period in accordance with the detection target component.

公开(公告)号：EP3719488A1

公开(公告)日：2020-10-07

申请号：EP18882884.2

申请日：2018-10-05

Applicant: Hamamatsu Photonics K.K.

Inventor： NAITO, Yasuhide ,  OHMURA, Takayuki ,  KOTANI, Masahiro

IPC: G01N27/62 ,  G01N27/64 ,  H01J49/04 ,  H01J49/16

Abstract: A laser desorption/ionization method, includes: a first step of preparing a sample support body including a substrate on which a plurality of through holes opening to a first surface and a second surface facing each other are formed, and a conductive layer provided on at least the first surface; a second step of introducing a sample and a solvent having refractoriness in a vacuum into the plurality of through holes; and a third step of ionizing a component of the sample by irradiating the first surface with laser beam while applying a voltage to the conductive layer.

公开(公告)号：EP3594675A1

公开(公告)日：2020-01-15

申请号：EP18764276.4

申请日：2018-03-01

Applicant: Hamamatsu Photonics K.K.

Inventor： NAITO, Yasuhide ,  KOTANI, Masahiro ,  OHMURA, Takayuki

IPC: G01N27/62 ,  G01N27/64

Abstract: A mass spectrometry device (200) according to one aspect of the invention includes: a sample stage (1) on which a sample (10) is placed and on which a sample support (2) having a substrate (21), in which a plurality of through-holes (S) passing from one surface (21a) thereof to the other surface (21b) thereof are provided, and a conductive layer (23), which covers at least a portion of the one surface (21a) which is not provided with the through-holes (S), is placed such that the other surface (21b) faces the sample (10); a laser beam application unit (201) that controls application of a laser beam (L) such that the laser beam (L) is applied to an imaging target region (R1) on the one surface (21a); and a detector (203) that detects the sample (10) ionized by the application of the laser beam (L) in a state where a positional relation of the sample (10) in the imaging target region (R1) is maintained.