摘要:
The present invention relates to an electron tube comprising, at least, a cathode electrode and a face plate having a photocathode which are arranged at one end of a body, and a stem arranged at the other end of the body for defining the position of an electron entrance surface where the electron emitted from the photocathode reaches. The object of the present invention is to provide an electron tube which can reduce its size and has a structure for improving the workability in its assembling process. In particular, the electron tube in accordance with the present invention comprises a bonding ring, provided between the face plate and the cathode electrode, for bonding the face plate and the cathode electrode together. The bonding ring is made of a metal material selected from the group consisting of In, Au, Pb, alloys containing In, and alloys containing Pb.
摘要:
This invention relates to an electron tube having a structure for enabling a stable operation for a long time. In the electron tube, at least a confining mechanism (60,61) is arranged between a photocathode (22) and the electron incident surface of a semiconductor device (40), which are arranged to oppose each other through a container. Particularly, the area of the opening of the confining mechanism is smaller than that of the electron incident surface, thereby confining the orbits of photoelectrons from the photocathode. This structure avoids bombardment of electrons arriving at portions other than the electron incident surface of the semiconductor device and prevents the semiconductor device from being unnecessarily charged.
摘要:
This invention relates to an electron tube having a structure for enabling a stable operation for a long time. In the electron tube, at least a confining mechanism (60,61) is arranged between a photocathode (22) and the electron incident surface of a semiconductor device (40), which are arranged to oppose each other through a container. Particularly, the area of the opening of the confining mechanism is smaller than that of the electron incident surface, thereby confining the orbits of photoelectrons from the photocathode. This structure avoids bombardment of electrons arriving at portions other than the electron incident surface of the semiconductor device and prevents the semiconductor device from being unnecessarily charged.
摘要:
An electron tube (1) in which a side tube (10) and a faceplate (21) are sealed together using a malleable metal (23) with a low melting point. The metal (23) is made to spread out along the outer surface of the faceplate (21) due to pressure from a first sealing portion (73) of a sealing metal support member and along the peripheral surface of the electron tube (1) due to pressure from a second sealing portion (74) of the sealing metal support member. Accordingly, the outer side of the corner portion formed by the faceplate (21) and the side tube (10) is covered with the metal (23). This construction not only reliably secures the input faceplate (21) to the side tube (10), but also is extremely effective in preserving the airtightness of the electron tube (1). Since the first sealing portion (73) is pressed toward the faceplate (21), an appropriate pressure can be applied to the metal (23) interposed between the first sealing portion (73) and the faceplate (21), improving the sealability of the metal (23) against the faceplate (21) and the first sealing portion (73). This construction is also appropriate for mass production of electron tubes (1).
摘要:
In a photomultiplier of the present invention, a semiconductor device (60) arranged in an envelope (20) to oppose a photocathode (40) is constituted by a semiconductor substrate of a first conductivity type, a carrier multiplication layer of a second conductivity type different from the first conductivity type, which is formed on the semiconductor substrate by epitaxial growth, a breakdown voltage control layer of the second conductivity type, which is formed on the carrier multiplication layer and has a dopant concentration higher than that of the carrier multiplication layer, a first insulating layer formed on the breakdown voltage control layer and said carrier multiplication layer while partially exposing the surface of the breakdown voltage control layer as a receptor for photoelectrons and consisting of a nitride, and an ohmic electrode layer formed on a peripheral surface portion of the receptor of the breakdown voltage control layer. When the dopant concentration distribution in the carrier multiplication layer is uniformly controlled on the basis of epitaxial growth, the uniformity of an avalanche multiplication gain for photoelectrons incident at different positions on the receptor of the semiconductor device is improved, thereby largely increasing the energy resolving power.