Method and apparatus for calibrating integrated circuit analog-to-digital converters
    1.
    发明公开
    Method and apparatus for calibrating integrated circuit analog-to-digital converters 失效
    用于校准集成模拟 - 数字转换器的方法和装置

    公开(公告)号:EP0889596A3

    公开(公告)日:2003-06-11

    申请号:EP98110847.5

    申请日:1998-06-12

    IPC分类号: H03M1/10

    CPC分类号: H03M1/1033 H03M1/12 H03M1/66

    摘要: The calibration method comprises the steps of: driving the analog-to-digital converter (ADC) with at least one test signal; calibrating the driven ADC over a series of successive ADC calibrations; generating a series of successive ADC figure of merit measurements for respective successive ADC calibrations, the series of successive ADC figure of merit measurements defining at least a portion of a curve having a local minimum/maximum; and stopping calibrating at an ADC calibration corresponding to the local minimum/maximum of the curve defined by the series of successive ADC figure of merit measurements. The step of calibrating comprises incrementally calibrating the ADC over the series of successive ADC calibrations. The method comprises the step of determining the local minimum/maximum of the curve. The step of determining comprises fitting an equation to the series of ADC figure of merit measurements; and calculating the local minimum/maximum based upon the equation. The step of fitting the equation comprises fitting the equation based upon a predetermined number of prior ADC figure of merit measurements. The step of fitting the equation may comprise fitting a polynomial equation, such as a third order equation, to the series of ADC figure of merit measurements.

    Method and apparatus for calibrating integrated circuit analog-to-digital converters
    2.
    发明公开
    Method and apparatus for calibrating integrated circuit analog-to-digital converters 失效
    Verfahren undGerätzur Kalibrierung integrierter Analog-Digital-Wandler

    公开(公告)号:EP0889596A2

    公开(公告)日:1999-01-07

    申请号:EP98110847.5

    申请日:1998-06-12

    IPC分类号: H03M1/10

    CPC分类号: H03M1/1033 H03M1/12 H03M1/66

    摘要: The calibration method comprises the steps of: driving the analog-to-digital converter (ADC) with at least one test signal; calibrating the driven ADC over a series of successive ADC calibrations; generating a series of successive ADC figure of merit measurements for respective successive ADC calibrations, the series of successive ADC figure of merit measurements defining at least a portion of a curve having a local minimum/maximum; and stopping calibrating at an ADC calibration corresponding to the local minimum/maximum of the curve defined by the series of successive ADC figure of merit measurements. The step of calibrating comprises incrementally calibrating the ADC over the series of successive ADC calibrations. The method comprises the step of determining the local minimum/maximum of the curve. The step of determining comprises fitting an equation to the series of ADC figure of merit measurements; and calculating the local minimum/maximum based upon the equation. The step of fitting the equation comprises fitting the equation based upon a predetermined number of prior ADC figure of merit measurements. The step of fitting the equation may comprise fitting a polynomial equation, such as a third order equation, to the series of ADC figure of merit measurements.

    摘要翻译: 该校准方法包括以下步骤:用至少一个测试信号驱动模拟 - 数字转换器(ADC); 通过一系列连续的ADC校准校准驱动ADC; 产生一系列连续的ADC品质因数测量值,用于相应的连续ADC校准,连续的ADC品质因数测量系列定义了具有局部最小/最大值的曲线的至少一部分; 并停止校准,该校准对应于由连续的ADC品质因数测量值定义的曲线的局部最小值/最大值。 校准步骤包括在连续的ADC校准系列中逐步校准ADC。 该方法包括确定曲线的局部最小/最大值的步骤。 确定步骤包括将方程拟合到一系列ADC品质因数测量; 并根据等式计算局部最小/最大值。 拟合方程的步骤包括基于预先确定数量的先验ADC品质因数测量值拟合方程式。 拟合方程的步骤可以包括将多项式方程(例如三阶方程)拟合到一系列ADC品质因数测量值。