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公开(公告)号：EP1982140A1
公开(公告)日：2008-10-22
申请号：EP06806158.9
申请日：2006-10-02
发明人： KELLER, Albert , HÄNGGLI, Markus , WEBER, Philipp , STUKER, Peter
CPC分类号： G01B7/087 , B29C47/0021 , B29C47/0026 , B29C47/0057 , B29C47/0059 , B29C47/009 , B29C47/065 , B29C47/92 , B29C2791/007 , B29C2947/92152 , B29C2947/92209 , B29C2947/92428 , B29C2947/92647 , B29C2947/92904 , B29K2023/06 , B29K2023/086 , B29K2023/12 , B29K2077/00
摘要： The invention relates to a method for determining the thickness of multi-layer films (13) comprising layers consisting of various non-conductive materials. According to said method, the thickness of the multi-layer film (13) is measured by a first sensor (17) and a second sensor (16) and optionally additional sensors, whereby all the sensors take a measurement at the same location under the same conditions if possible. The first sensor (17) and the second (16) or additional sensors generate different measured values for layers of the multi-layer film (13) of the same thickness consisting of the same material (13). The measured signals of the sensors (16, 17) are fed to a computer (18), which determines the total thickness of the multi-layer film (13) and/or the thickness of the individual layers of the multi-layer film (13) from the different measured values of the first sensor (17) and the second (16) or additional sensors.
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公开(公告)号：EP1969304A1
公开(公告)日：2008-09-17
申请号：EP06792356.5
申请日：2006-10-02
CPC分类号： G01B7/087 , B29C47/0021 , B29C47/0026 , B29C47/0057 , B29C47/0059 , B29C47/009 , B29C47/065 , B29C47/92 , B29C2791/007 , B29C2947/92152 , B29C2947/92209 , B29C2947/92428 , B29C2947/92647 , B29C2947/92904 , B29K2023/06 , B29K2023/086 , B29K2023/12 , B29K2077/00
摘要： The invention relates to a method for determining the thickness of multi-layer films (13) comprising layers consisting of various non-conductive materials. According to said method, the thickness of the multi-layer film (13) is measured by a first sensor (17) and a second sensor (16) and optionally additional sensors. The first sensor (17) measures the profile of the total thickness in a short cycle with a duration of approximately 1-2 minutes, but with a large measuring error margin. The second sensor (16) measures the profile of the total thickness with a small measuring error margin but in a long cycle with a duration of approximately 10 to 30 minutes. A correction profile for the first sensor (17) can be calculated by comparing the two thickness profiles. Provided that this correction profile remains constant throughout the long cycle, it can be applied to all thickness profiles of the sensor (17) until a new, more accurate thickness profile is made available by the second sensor, permitting the calculation of a new correction profile.
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公开(公告)号：EP1969304B1
公开(公告)日：2009-06-03
申请号：EP06792356.5
申请日：2006-10-02
CPC分类号： G01B7/087 , B29C47/0021 , B29C47/0026 , B29C47/0057 , B29C47/0059 , B29C47/009 , B29C47/065 , B29C47/92 , B29C2791/007 , B29C2947/92152 , B29C2947/92209 , B29C2947/92428 , B29C2947/92647 , B29C2947/92904 , B29K2023/06 , B29K2023/086 , B29K2023/12 , B29K2077/00
摘要： The invention relates to a method for determining the thickness of multi-layer films (13) comprising layers consisting of various non-conductive materials. According to said method, the thickness of the multi-layer film (13) is measured by a first sensor (17) and a second sensor (16) and optionally additional sensors. The first sensor (17) measures the profile of the total thickness in a short cycle with a duration of approximately 1-2 minutes, but with a large measuring error margin. The second sensor (16) measures the profile of the total thickness with a small measuring error margin but in a long cycle with a duration of approximately 10 to 30 minutes. A correction profile for the first sensor (17) can be calculated by comparing the two thickness profiles. Provided that this correction profile remains constant throughout the long cycle, it can be applied to all thickness profiles of the sensor (17) until a new, more accurate thickness profile is made available by the second sensor, permitting the calculation of a new correction profile.
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