公开(公告)号：EP2353648A1

公开(公告)日：2011-08-10

申请号：EP11000504.8

申请日：2011-01-21

申请人： Hitachi, Ltd.

发明人： Shinagawa, Ryosuke ,  Matsuda, Koji ,  Nakano, Tatsuya

IPC分类号： A61N5/10

CPC分类号： A61N5/10 ,  A61N2005/1061 ,  A61N2005/1087

摘要： A particle beam treatment apparatus and an irradiation nozzle apparatus achieve a beam with a small diameter by a beam scanning irradiation method, and ensure a space for installation of a beam transport chamber in the irradiation nozzle apparatus. An X-ray tube is located outside the scanning type irradiation nozzle apparatus that includes scanning magnets, while an X-ray tube is located in an irradiation nozzle apparatus in a conventional structure. An X-ray detector is located inside the irradiation nozzle apparatus. The thickness of the X-ray detector in the direction of a beam axis is smaller and the structure thereof is simpler than that of the X-ray tube. This makes it possible to ensure the space for installation of the beam transport chamber in the irradiation nozzle apparatus and to increase the length of the beam transport chamber that is included in the irradiation nozzle apparatus. It is, therefore, possible to suppress scattering of a beam due to air during transport of the beam and reduce the diameter of the beam compared with a conventional apparatus.

摘要翻译： 粒子束处理装置和照射喷嘴装置通过射束扫描照射方法实现小直径的射束，并且确保用于在照射喷嘴装置中安装射束传输室的空间。 X射线管位于包括扫描磁体的扫描型照射喷嘴装置的外部，而X射线管位于传统结构的照射喷嘴装置中。 X射线检测器位于照射喷嘴装置内部。 X射线检测器在射束轴方向的厚度较小，其结构比X射线管的结构简单。 由此，能够确保照射喷嘴装置中的光束输送室的设置空间，能够增大照射喷嘴装置所具备的光束输送室的长度。 因此，与常规设备相比，可以抑制在传输光束期间由于空气引起的光束散射，并且减小光束的直径。

公开(公告)号：EP2910279A1

公开(公告)日：2015-08-26

申请号：EP15156580.1

申请日：2015-02-25

申请人： Hitachi, Ltd.

发明人： Nishimura, Arao ,  Akiyama, Hiroshi ,  Shinagawa, Ryosuke ,  Fujita, Takeshi

IPC分类号： A61N5/10

CPC分类号： A61N5/1075 ,  A61N5/1043 ,  A61N5/1048 ,  A61N5/1067 ,  A61N2005/1074 ,  A61N2005/1087

摘要： A scanning magnet (28, 29) of an irradiation nozzle (27) is controlled to irradiate the ion beam irradiated from a synchrotron accelerator to a target position P i,j of a spot i,j in a certain layer L i of a target volume, using a scanning control apparatus (40). A deviation D j between the target position P i,j and an actual irradiation position Pa i,j is obtained. Using the deviation D j , a systematic error Es i,j and a random error Er i,j of the actual irradiation position Pa i,j are obtained. Whether the systematic error Es i,j exists within a first permissible range of the systematic error Es i,j is determined. Whether the random error Er i,j exists within a second permissible range of the random error Er i,j is determined. When the systematic error Es i,j or the random error Er i,j is deviated from the permissible range, the irradiation of the ion beam to the target volume is stopped.

摘要翻译： 控制照射喷嘴（27）的扫描磁体（28,29）以将从同步加速器照射的离子束照射到目标的某个层L i中的点i，j的目标位置P i，j 体积，使用扫描控制装置（40）。 获得目标位置P i，j与实际照射位置Pa i，j之间的偏差D j。 使用偏差D j，获得实际照射位置Pa i，j的系统误差Es i，j和随机误差Er i，j。 系统误差Es i，j是否存在于系统误差Es i，j的第一允许范围内。 随机误差Er i，j是否存在于随机误差Er i的第二允许范围内，j被确定。 当系统误差Es i，j或随机误差Er i，j偏离容许范围时，停止对目标体积的离子束的照射。

公开(公告)号：EP2910279B1

公开(公告)日：2018-07-04

申请号：EP15156580.1

申请日：2015-02-25

申请人： Hitachi, Ltd.

发明人： Nishimura, Arao ,  Akiyama, Hiroshi ,  Shinagawa, Ryosuke ,  Fujita, Takeshi

IPC分类号： A61N5/10

CPC分类号： A61N5/1075 ,  A61N5/1043 ,  A61N5/1048 ,  A61N5/1067 ,  A61N2005/1074 ,  A61N2005/1087

摘要： A scanning magnet (28, 29) of an irradiation nozzle (27) is controlled to irradiate the ion beam irradiated from a synchrotron accelerator to a target position P i,j of a spot i,j in a certain layer L i of a target volume, using a scanning control apparatus (40). A deviation D j between the target position P i,j and an actual irradiation position Pa i,j is obtained. Using the deviation D j , a systematic error Es i,j and a random error Er i,j of the actual irradiation position Pa i,j are obtained. Whether the systematic error Es i,j exists within a first permissible range of the systematic error Es i,j is determined. Whether the random error Er i,j exists within a second permissible range of the random error Er i,j is determined. When the systematic error Es i,j or the random error Er i,j is deviated from the permissible range, the irradiation of the ion beam to the target volume is stopped.

公开(公告)号：EP2923733B1

公开(公告)日：2018-05-02

申请号：EP15155323.7

申请日：2015-02-17

申请人： Hitachi, Ltd.

发明人： Ito, Yuki ,  Matsuda, Koji ,  Shinagawa, Ryosuke ,  Tadokoro, Masahiro ,  Nishimura, Arao

IPC分类号： A61N5/10

CPC分类号： A61N5/1077 ,  A61N5/103 ,  A61N5/1043 ,  A61N5/1067 ,  A61N5/1071 ,  A61N2005/1074 ,  A61N2005/1087

摘要： The charged particle beam irradiation system (1) includes a charged particle beam generating unit for accelerating a charged particle beam, scanning electromagnets for scanning the charged particle beam, a beam irradiation apparatus (5) for irradiating the accelerated charged particle beam to irradiation spots of an irradiation target, beam radiation dose measuring instrument (s) (59) for obtaining a dose of the charged particle beam passing through the beam irradiation apparatus, and a beam position measuring instrument for obtaining one or both of the position and the width of the beam scanned by the scanning electromagnets. The beam position measuring instrument (58) obtains one or both of the position and the width of the beam for each irradiation spot and determines whether the obtained result is within an allowable range and obtains one or both of the position and the width of the charged particle beam for each split during irradiation to the spot with the charged particle beam regarding a split of which a dose is managed by dividing a part of or all of irradiation spots into irradiation sections and determines whether the obtained result is within an allowable range.

公开(公告)号：EP2353648B1

公开(公告)日：2016-03-30

申请号：EP11000504.8

申请日：2011-01-21

申请人： Hitachi, Ltd.

发明人： Shinagawa, Ryosuke ,  Matsuda, Koji ,  Nakano, Tatsuya

IPC分类号： A61N5/10

CPC分类号： A61N5/10 ,  A61N2005/1061 ,  A61N2005/1087

公开(公告)号：EP2923733A1

公开(公告)日：2015-09-30

申请号：EP15155323.7

申请日：2015-02-17

申请人： Hitachi, Ltd.

发明人： Ito, Yuki ,  Matsuda, Koji ,  Shinagawa, Ryosuke ,  Tadokoro, Masahiro ,  Nishimura, Arao

IPC分类号： A61N5/10

CPC分类号： A61N5/1077 ,  A61N5/103 ,  A61N5/1043 ,  A61N5/1067 ,  A61N5/1071 ,  A61N2005/1074 ,  A61N2005/1087

摘要： The charged particle beam irradiation system (1) includes a charged particle beam generating unit for accelerating a charged particle beam, scanning electromagnets for scanning the charged particle beam, a beam irradiation apparatus (5) for irradiating the accelerated charged particle beam to irradiation spots of an irradiation target, beam radiation dose measuring instrument (s) (59) for obtaining a dose of the charged particle beam passing through the beam irradiation apparatus, and a beam position measuring instrument for obtaining one or both of the position and the width of the beam scanned by the scanning electromagnets. The beam position measuring instrument (58) obtains one or both of the position and the width of the beam for each irradiation spot and determines whether the obtained result is within an allowable range and obtains one or both of the position and the width of the charged particle beam for each split during irradiation to the spot with the charged particle beam regarding a split of which a dose is managed by dividing a part of or all of irradiation spots into irradiation sections and determines whether the obtained result is within an allowable range.

摘要翻译： 该带电粒子束照射系统（1）具有：带电粒子束加速带电粒子束生成部，扫描该带电粒子束的扫描电磁铁，照射加速带电粒子束的照射点的束照射装置（5） 照射对象，射束照射剂量测量仪（59），用于获得通过射束照射装置的带电粒子束的剂量;以及射束位置测量仪器，用于获得射束照射装置的位置和宽度中的一个或两个 光束由扫描电磁铁扫描。 光束位置测量器（58）针对每个照射点获得光束的位置和宽度中的一个或两个，并且确定获得的结果是否在允许范围内并且获得被充电的位置和宽度中的一个或两个 通过将照射点的一部分或全部分割为照射部来管理剂量的分割，并照射带斑点带电粒子束的斑点的每个分割粒子束，并判断所得到的结果是否在允许范围内。