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    Correction circuit and real-time clock circuit
    1.
    发明公开
    Correction circuit and real-time clock circuit 有权
    Korrekturschaltung und Echtzeittaktschaltung

    公开(公告)号：EP2772822A1

    公开(公告)日：2014-09-03

    申请号：EP14156943.4

    申请日：2014-02-27

    申请人： Huawei Technologies Co., Ltd.

    发明人： Liu, Jinxiu ,  Guo, Shubao ,  Li, Ding

    IPC分类号： G06F1/14 ,  G04G3/02 ,  H03L1/00 ,  G06F1/32

    CPC分类号： H03K21/02 ,  G04G3/04 ,  G06F1/14 ,  G06F1/32 ,  H03L1/00

    摘要： The present document discloses a correction circuit. The correction circuit includes a frequency dividing circuit (110), a frequency dividing coefficient operation circuit (120), a built-in temperature collection circuit (130), and a power-on and power-off detection circuit (140). The built-in temperature collection circuit (130) is configured to collect a temperature of the chip; the power-on and power-off detection circuit (140) is configured to detect power-on and power-off of the chip; the frequency dividing coefficient operation circuit (120) is configured to calculate, according to the temperature of the chip collected by the built-in temperature collection circuit (130) when the power-on and power-off detection circuit (140) detects that the chip is powered off, a frequency dividing coefficient, and output the frequency dividing coefficient to the frequency dividing circuit (110); and the frequency dividing circuit (110) is configured to provide, according to the frequency dividing coefficient output by the frequency dividing coefficient operation circuit, a timing pulse for a real-time clock (11).

    摘要翻译： 本文件公开了一种校正电路。 校正电路包括分频电路（110），分频系数运算电路（120），内置温度采集电路（130）以及通电断电检测电路（140）。 内置的温度采集电路（130）被配置为收集芯片的温度; 上电断电检测电路（140）被配置为检测芯片的通电和断电; 分频系数运算电路（120）被配置为当电源接通和断电检测电路（140）检测到所述内部温度采集电路（130）检测到的所述内部温度采集电路（130）所收集的芯片的温度时， 芯片断电，分频系数，并将分频系数输出到分频电路（110）; 并且分频电路（110）根据由分频系数运算电路输出的分频系数，提供实时时钟（11）的定时脉冲。