摘要:
An optical sensor includes an optical fiber inscribed with a repeated refraction pattern such that light scattered from a location on the optical fiber is scattered at multiple frequencies in a range of frequencies. The inscribed patterns overlap at every measurement point along at least a portion of the length of the sensor. An optical sensing system including control circuitry coupled to the optical fiber detects measurement scatter data from the optical fiber over the range of frequencies, determines a change in the detected measurement scatter data over the range of frequencies, and extracts a parameter describing a state of the optical fiber from the determined change in the detected measurement scatter data. The sensor may be made by inscribing a first light refracting pattern on the optical fiber at every measurement point along at least a portion of the length of the sensor and inscribing a second light refracting pattern on the optical fiber that overlaps the first inscribed light refracting pattern at every measurement point along at least that portion of the length of the sensor.
摘要:
An interferometric measurement system suppresses cross talk between optical waveguides used to measure one or more parameters. A first interferometric measurement channel coupled to a first waveguide, and a second interferometric measurement channel coupled to a second waveguide. At least one of the channels includes a reference light path in addition to the first and second waveguides. A reference path optical delay is associated with the reference light path, a first optical delay is associated with the input portion of at least one of the first and second interferometric measurement channels, and a second optical delay is associated with an output portion of the one interferometric measurement channel. A value of the first optical delay and a value the second optical delay are chosen to suppress crosstalk associated with the other of the first and second interferometric measurement channels in the one interferometric measurement channel over a predetermined length of the first waveguide. Signals corresponding to the reference light path and the first and second interferometric measurement channels are processed to measure one or more parameters.
摘要:
An interferometric measurement system measures a parameter using at least one optical waveguide. A memory stores reference interferometric pattern data associated with a segment of the optical waveguide. Interferometric detection circuitry detects and stores measurement interferometric pattern data associated with the segment of the optical waveguide during a measurement operation. A spectral range of the reference interferometric pattern of the optical waveguide is greater than a spectral range of the measurement interferometric pattern of the optical waveguide. A processor shifts one or both of the measurement interferometric pattern data and the reference interferometric pattern data relative to the other to obtain a match and to use the match to measure the parameter. An example parameter is strain.
摘要:
An optical interrogation system, e.g., an OFDR-based system, measures local changes, of index of refraction of a sensing light guide subjected to a time-varying disturbance. Interferometric measurement signals detected for a length of the sensing light guide are transformed into the spectral domain. A time varying signal is determined from the transformed interferometric measurement data set. A compensating signal is determined from the time varying signal which is used to compensate the interferometric measurement data set for the time-varying disturbance. Further robustness is achieved using averaging and strain compensation. The compensation technique may be applied along the length of the light guide.
摘要:
An accurate measurement method and apparatus are disclosed for shape sensing with a multi-core fiber. A change in optical length is detected in ones of the cores in the multi-core fiber up to a point on the multi-core fiber. A location and/or a pointing direction are/is determined at the point on the multi-core fiber based on the detected changes in optical length. The accuracy of the determination is better than 0.5% of the optical length of the multi-core fiber up to the point on the multi-core fiber. In a preferred example embodiment, the determining includes determining a shape of at least a portion of the multi-core fiber based on the detected changes in optical length.
摘要:
An optical frequency domain reflectometry (OFDR) measurement is produced from an OFDR apparatus that includes a tunable laser source coupled to a sensing interferometer and a monitor interferometer. The sensing interferometer is also coupled to a waveguide, e.g., an optical sensing fiber. Sensor interferometric data obtained by the OFDR measurement is processed in the spectral domain (e.g., frequency) with one or more parameters to compensate for the optical dispersion associated with the sensing interferometer data. A Fourier Transform of the dispersion-compensated sensing interferometric data in the spectral domain is performed to provide a dispersion-compensated OFDR measurement information in the temporal (e.g., time) domain.