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公开(公告)号：EP4060371A1
公开(公告)日：2022-09-21
申请号：EP22162691.4
申请日：2022-03-17
摘要： In an embodiment, a method for testing a millimeter-wave radar module includes: providing power to the millimeter-wave radar module; performing a plurality of tests indicative of a performance level of the millimeter-wave radar module; comparing respective results from the plurality of tests with corresponding test limits; and generating a flag when a result from a test of the plurality of test is outside the corresponding test limits, where performing the plurality of tests includes: transmitting a signal with a transmitting antenna coupled to a millimeter-wave radar sensor, modulating the transmitted signal with a test signal, and capturing first data from a first receiving antenna using an analog-to-digital converter of the millimeter-wave radar sensor, where generating the flag includes generating the flag based on the captured first data.
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公开(公告)号：EP3859376A1
公开(公告)日：2021-08-04
申请号：EP21154346.7
申请日：2021-01-29
摘要： In an embodiment, a method includes: receiving a global trigger with a first millimeter-wave radar; receiving the global trigger with a second millimeter-wave radar; generating a first internal trigger of the first millimeter-wave radar after a first offset duration from the global trigger; generating a second internal trigger of the second millimeter-wave radar after a second offset duration from the global trigger; start transmitting first millimeter-wave radar signals with the first millimeter-wave radar based on the first internal trigger; and start transmitting second millimeter-wave radar signals with the second millimeter-wave radar based on the second internal trigger, where the second offset duration is different from the first offset duration, and where the first and second millimeter-wave radar signals are transmitted sequentially so as to exhibit no temporal overlap.
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公开(公告)号：EP3843269A3
公开(公告)日：2021-09-29
申请号：EP20216781.3
申请日：2020-12-23
发明人： ALBEL, Siegfried , AICHNER, Michael , JUNGMAIER, Reinhard-Wolfgang , NOPPENEY, Dennis , RUMPLER, Christoph , TROTTA, Saverio
摘要： In accordance with an embodiment, a method includes: receiving, by an adjustable frequency doubling circuit, a first clock signal having a first clock frequency; using the adjustable frequency doubling circuit, generating a second clock signal having a second clock frequency that is twice the first clock frequency; measuring a duty cycle parameter of the second clock signal, where the duty cycle parameter is dependent on a duty cycle of the first clock signal or a duty cycle of the second clock signal; and using the adjustable frequency doubling circuit, adjusting the duty cycle of the first clock signal or the second clock signal based on the measuring.
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公开(公告)号：EP3843269A2
公开(公告)日：2021-06-30
申请号：EP20216781.3
申请日：2020-12-23
发明人： ALBEL, Siegfried , AICHNER, Michael , JUNGMAIER, Reinhard-Wolfgang , NOPPENEY, Dennis , RUMPLER, Christoph , TROTTA, Saverio
摘要： In accordance with an embodiment, a method includes: receiving, by an adjustable frequency doubling circuit, a first clock signal having a first clock frequency; using the adjustable frequency doubling circuit, generating a second clock signal having a second clock frequency that is twice the first clock frequency; measuring a duty cycle parameter of the second clock signal, where the duty cycle parameter is dependent on a duty cycle of the first clock signal or a duty cycle of the second clock signal; and using the adjustable frequency doubling circuit, adjusting the duty cycle of the first clock signal or the second clock signal based on the measuring.
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公开(公告)号：EP3859542A1
公开(公告)日：2021-08-04
申请号：EP21154320.2
申请日：2021-01-29
IPC分类号： G06F13/42
摘要： In an embodiment, a method for writing to a set of serial peripheral interface (SPI) slaves coupled to an SPI bus includes: disabling master in slave out (MISO) drivers of the set of SPI slaves using the SPI bus; after disabling the MISO drivers, setting respective slave selection terminals of the set of SPI slaves to an active state; and after setting the respective slave selection terminals of the set of SPI slaves to the active state, simultaneously writing data to the set of SPI slaves using a master out slave in (MOSI) line.
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公开(公告)号：EP3771913A1
公开(公告)日：2021-02-03
申请号：EP20188721.3
申请日：2020-07-30
IPC分类号： G01R31/302 , G01R1/04 , G01R31/28 , H01P5/00 , G01R31/317 , H05K1/02
摘要： A test assembly for testing an antenna-in-package (AiP) device (150) includes a socket (261) over a circuit board (270), where the socket includes an opening (260) for receiving the AiP device; a plunger (263) configured to move along sidewalls of the opening, where during testing of the AiP device, the plunger is configured to cause the AiP device to be pressed towards the circuit board such that the AiP device is operatively coupled to the circuit board via input/output connections of the AiP device and of the circuit board; and a loadboard (250) disposed within the socket and between the plunger and the AiP device, where the loadboard includes a coupling structure configured to be electromagnetically coupled to a transmit antenna (143) and to a receive antenna (145) of the AiP device, so that testing signals transmitted by the transmit antenna are conveyed to the receive antenna externally relative to the AiP device through the coupling structure.
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