公开(公告)号：EP0355241A1

公开(公告)日：1990-02-28

申请号：EP88810570.7

申请日：1988-08-18

申请人： International Business Machines Corporation

发明人： Alvarado, Santos F., Dr. ,  Baratoff, Alexis, Prof. Dr. ,  Pohl, Wolfgang Dieter, Dr.

IPC分类号： G01N27/00

CPC分类号： G01Q60/16 ,  G01Q60/56 ,  Y10S977/86 ,  Y10S977/861

摘要： In a preferred embodiment of this scanning tunneling microscope, the tunnel tip (15) consists of an optically transparent body coated with a semiconductor layer, such as a GaAs layer. The sample (19) being investigated consists of a magnetic material. Tunnel microscope operation permits to investigate the magnetic properties at or near the surface of the sample (19) if a spin-polarized beam of light (21) is shed onto the sample (19), either through the transparent body of the tunnel tip (15), from below through the sample (19), or from the side. In addition to conventional scanning tunneling microscope electronics (20), an oscillator-controlled (24) phase-sensitive detector or gating means (26) and a display unit (27) are provided for direct viewing of the magnetic properties and the topography of the sample (19).

摘要翻译： 在该扫描隧道显微镜的优选实施例中，隧道尖端（15）由涂覆有诸如GaAs层的半导体层的光学透明体构成。 正在研究的样品（19）由磁性材料构成。 隧道显微镜操作允许调查样品（19）表面处或附近的磁特性，如果自旋偏振光束（21）通过隧道末端的透明体（21）流到样品（19）上 15），从下方通过样品（19），或从侧面。 除了传统的扫描隧道显微镜电子器件（20）之外，提供了振荡器控制的（24）相敏检测器或门控装置（26）和显示单元（27），用于直接观察磁特性和 样品（19）。