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1.发明公开System and method for automatically testing integrated circuit memory arrays on different memory array testers 失效用于自动测试不同存储器阵列测试仪的集成电路存储器阵列的系统和方法
公开(公告)号：EP0135864A3
公开(公告)日：1988-04-20
申请号：EP84110538
申请日：1984-09-05
IPC分类号： G11C29/00
CPC分类号： G11C29/56 , F02B2075/027 , G01R31/318342 , G01R31/31908 , G11C29/54
摘要： A system for automatically testing a plurality of memory arrays (25A... 25X) on selected memory array testers (21A... 21X) includes an interactive data entry device (12) for entering array test specifications (20A...20N) including characterizing information, DC testing parameters, AC testing parameters and AC test pattern choices for the array. The test specifications are entered in a format which is independent of a particular tester's characteristics. A universal language generator (14) generates a tester independent universal language instruction sequence (16) for carrying out the prescribed tests based upon the entered test specifications. Associated with each tester is a language translator (19A... 19X) which translates the tester independent universal language instruction sequence into an instruction sequence which is particular to the associated tester (21A ... 21X). The tester dependent instruction sequence (30A ... 30X) may be loaded into the associated tester to produce the test signals for testing the memory array (25A... 25X).
摘要翻译： 用于自动测试所选择的存储器阵列测试仪上的多个存储器阵列的系统包括用于输入阵列测试规范的交互式数据输入装置，包括阵列的特征信息，DC测试参数，AC测试参数和AC测试模式选择。 测试规格以独立于特定测试仪特性的格式输入。 通用语言生成器生成测试仪独立的通用语言指令序列，用于根据输入的测试规范执行规定的测试。 与每个测试器相关联的是通用语言翻译器，其将测试仪独立的通用语言指令序列转换成相关测试仪特有的指令序列。 测试仪相关指令序列可以被加载到相关联的测试器中以产生用于测试存储器阵列的测试信号。
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2.发明公开System and method for automatically testing integrated circuit memory arrays on different memory array testers 失效用于自动系统和方法的测试构造对存储器阵列不同审查员集成电路存储器阵列。
公开(公告)号：EP0135864A2
公开(公告)日：1985-04-03
申请号：EP84110538.0
申请日：1984-09-05
IPC分类号： G11C29/00
CPC分类号： G11C29/56 , F02B2075/027 , G01R31/318342 , G01R31/31908 , G11C29/54
摘要： A system for automatically testing a plurality of memory arrays (25A... 25X) on selected memory array testers (21A... 21X) includes an interactive data entry device (12) for entering array test specifications (20A...20N) including characterizing information, DC testing parameters, AC testing parameters and AC test pattern choices for the array. The test specifications are entered in a format which is independent of a particular tester's characteristics. A universal language generator (14) generates a tester independent universal language instruction sequence (16) for carrying out the prescribed tests based upon the entered test specifications. Associated with each tester is a language translator (19A... 19X) which translates the tester independent universal language instruction sequence into an instruction sequence which is particular to the associated tester (21A ... 21X). The tester dependent instruction sequence (30A ... 30X) may be loaded into the associated tester to produce the test signals for testing the memory array (25A... 25X).
摘要翻译： 一种用于选择的存储器阵列上的自动测试存储器阵列的所述多个系统包括测试者交互式数据输入装置用于输入阵列测试规范，包括表征信息，DC检测参数，AC测试参数和用于阵列AC测试图案的选择。 测试规范中设定的格式全部是独立的特定测试的特征输入。 一种通用语言生成基因费率进行基于输入的测试规范规定的测试的测试器独立的通用语言指令序列。 每个测试器相关联是一种通用语言翻译其中反式鲈测试仪独立通用语言指令序列到在所有的指令序列是特别相关的测试。 该测试器相关的指令序列可以被加载到相关联的测试仪，以产生测试信号用于测试存储器阵列。
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