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    SEMICONDUCTOR DEVICE TEST SYSTEM
    3.
    发明公开
    SEMICONDUCTOR DEVICE TEST SYSTEM 有权
    半导体部件检查系统

    公开(公告)号：EP2220509A1

    公开(公告)日：2010-08-25

    申请号：EP08859045.0

    申请日：2008-10-17

    申请人： International Trading & Technology Co., Ltd.

    发明人： CHANG, Kyung-hun ,  OH, Se-kyung ,  LEE, Eung-sang

    IPC分类号： G01R31/26

    CPC分类号： G01R31/31924 ,  G01R31/31905

    摘要： A semiconductor device test system is disclosed. The semiconductor device test system extends driver- and comparator- functions acting as important functions of a test header to an external part (e.g., a HIFIX board) of the test header, such that it can double the productivity of a test without upgrading the test header. The semiconductor device test system includes a test header for testing a semiconductor device by a test controller, and a HIFIX board for establishing an electrical connection between the semiconductor device and the test header, and including a Device Under Test (DUT) test unit which processes a read signal generated from the semiconductor device by making one pair with a driver of the test header and transmits the processed read signal to the test header.

    MULTIPLY APPARATUS FOR SEMICONDUCTOR TEST PATTERN SIGNAL
    4.
    发明公开
    MULTIPLY APPARATUS FOR SEMICONDUCTOR TEST PATTERN SIGNAL 有权
    乘数半导体测试图案

    公开(公告)号：EP2212889A1

    公开(公告)日：2010-08-04

    申请号：EP08842944.4

    申请日：2008-10-17

    申请人： International Trading & Technology Co., Ltd.

    发明人： CHANG, Kyung-hun ,  OH, Se-kyung

    IPC分类号： G11C29/00

    CPC分类号： G11C29/56 ,  G01R31/31928 ,  G11C29/56004 ,  G11C29/56012

    摘要： An apparatus for multiplying a semiconductor test pattern signal is disclosed. The multiplying apparatus firstly encodes a plurality of pattern signals to have different pattern types, and multiplies the encoded pattern signals according to an exclusive-OR (XOR) scheme in order to generate a single pattern signal, thereby recognizing a relationship between a pattern signal before the multiplication and the other pattern signal after the multiplication. A pattern-signal segment ing/ out put ting unit segments a semiconductor test pattern signal into a plurality of pattern signals, and simultaneously outputs the segmented pattern signals. A pattern-signal restoring/multiplying unit restores the segmented pattern signals received from the pattern-signal segment ing/ out put ting unit to the semiconductor test pattern signal, outputs the restored result to a driver which records a test pattern in an objective semiconductor to be tested, and multiplies the signal output ted to the driver by a predetermined frequency band rather than a frequency band of the segmented signals.