摘要:
A buffer circuit comprises an output circuit that keeps the output impedance constant and that outputs an output signal having an output voltage that is approximately the same as the input voltage of an input signal; first and second transistors that are series connected to respective terminals of the output circuit and that supply, to the respective terminals thereof, voltages in accordance with the magnitude of the input or output voltage so as to reduce the power consumption in the output circuit for protection thereof; a first base voltage control unit that supplies a base voltage to the first transistor to control the first transistor; and a second base voltage control unit that supplies a base voltage to the second transistor to control the second transistor.
摘要:
A testing system comprises a configurable integrated circuit that selectively communicates with one or more of N external impedances, that has M predetermined configurations that are selected based on an electrical characteristic of the one or more of the N external impedances, where N and M are integers greater than one. The configurable integrated circuit generates a selected one of M discrete values of an output characteristic of the configurable integrated circuit based on the selected one of the M predetermined configurations. An integrated circuit is tested in accordance with an output of the configurable integrated circuit.
摘要:
There is provided an electric power applying circuit for applying a direct current power to a load. The electric power applying circuit includes an output buffer that (i) is supplied with, as power source voltages, positive and negative high voltages which are determined in accordance with a range of an applied voltage which is to be applied to the load, (ii) generates a voltage in accordance with an input voltage, within a range defined by the power source voltages, and (iii) applies the generated voltage to the load, a main amplifier that amplifies a voltage input thereto to generate the input voltage, and inputs the generated input voltage into the output buffer, wherein the main amplifier exhibits a higher accuracy in terms of voltage generation than the output buffer, and a floating power source that generates positive and negative floating voltages by using, as a reference, a voltage determined in accordance with a voltage output from the output buffer, and supplies the generated positive and negative floating voltages to the main amplifier as power source voltages thereof, wherein a difference in voltage between the positive and negative floating voltages is smaller than a difference in voltage between the positive and negative high voltages.
摘要:
The invention relates to a method for the diagnosis of driver outputs (20) and to a diagnosis pulse manager (10) that can supply a pulse to a driver output (20) in order to carry out a diagnosis of said driver output. As a plurality of diagnosis pulses may be required simultaneously for the system requirements (12), a diagnosis pulse requirement register (14) and a diagnosis pulse execution register (16) are provided such that a plurality of simultaneous requirements (12) can be stored. On the basis of the buffering of requirements (12), a plurality of stored pulse requirements can be successively taken into account according to pre-determined rules.
摘要:
Apparatus that provides an output voltage to a device under test (DUT) includes a reference waveform generator to provide a waveform having a predefined swing, where the waveform is an analog signal that is based on data, a digital-to-analog converter (DAC) to receive the waveform, to scale the waveform using a scaling factor to produce a scaled waveform, and to generate a current that corresponds to the scaled waveform, and a resistive circuit connected to a circuit path that leads to the DUT. The current passing through the resistive circuit produces a voltage drop. The output voltage is based, at least in part, on the voltage drop.
摘要:
An apparatus is described for burn-in and/or functional testing of microelectronic circuits of unsingulated wafers. A large number of power, ground, and signal connections can be made to a large number of contacts on a wafer. The apparatus has a cartridge that allows for fanning-in of electric paths. A distribution board has a plurality of interfaces that are strategically positioned to provide a dense configuration. The interfaces are connected through flexible attachments to an array of first connector modules. Each one of the first connector modules can be independently connected to a respective one of a plurality of second connector modules, thereby reducing stresses on a frame of the apparatus. Further features include for example a piston that allows for tight control of forces exerted by terminals onto contacts of a wafer.
摘要:
A method of and system for producing signals to test semiconductor devices includes a pin electronic (PE) stage for providing a parametric measurement unit (PMU) current test signal to a semiconductor device under test. The PE stage also senses a response from the semiconductor device under test.