公开(公告)号：EP3759498A1

公开(公告)日：2021-01-06

申请号：EP19713244.2

申请日：2019-02-28

Applicant: Ionpath, Inc.

Inventor： STUMBO, David ,  BENDALL, Sean ,  ANGELO, Michael ,  THOMPSON, Stephen ,  FIENBERG, Harris

IPC: G01N33/68 ,  H01J49/00 ,  H01J49/40 ,  H01J49/06 ,  H01J49/16

公开(公告)号：EP4163637A1

公开(公告)日：2023-04-12

申请号：EP22188245.9

申请日：2019-02-28

Applicant: Ionpath, Inc.

Inventor： STUMBO, David ,  BENDALL, Sean ,  ANGELO, Michael ,  THOMPSON, Stephen ,  FIENBERG, Harris

IPC: G01N33/68 ,  H01J49/14

Abstract: The disclosure features methods and systems that include directing an ion beam to a region of a sample to liberate charged particles from the region of the sample, where the directed ion beam is pulsed at a first repetition rate, deflecting a first subset of the liberated charged particles from a first path to a second path different from the first path in response to a gate signal synchronized with the repetition rate of the pulsed ion beam, and detecting the first subset of the liberated charged particles in a time-of-flight (TOF) mass spectrometer to determine information about the sample, where the gate signal sets a common reference time for the TOF mass spectrometer for the first subset of charged particles liberated by each pulse of the ion beam.