PROCESSING DEVICE AND RADAR SYSTEM
    1.
    发明公开

    公开(公告)号:EP4421519A1

    公开(公告)日:2024-08-28

    申请号:EP23212957.7

    申请日:2023-11-29

    发明人: SEKIYA, Ryota

    摘要: According to one arrangement, a processing device includes a processor (13). The processor (13) is configured to acquire first radar echoes from a plurality of first antennas (1,2), generate a first radar image by calculating a spatial correlation between the first radar echoes represented by complex numbers, acquire second radar echoes from a plurality of second antennas (1,2), generate a second radar image by calculating a spatial correlation between the second radar echoes represented by complex numbers, and generate a third radar image by applying at least one of a first synthesis method by synthesis of pixel values represented by complex numbers or a second synthesis method by image synthesis to the generated first and second radar images.

    RADAR SYSTEM
    3.
    发明公开
    RADAR SYSTEM 审中-实审

    公开(公告)号:EP4397991A1

    公开(公告)日:2024-07-10

    申请号:EP23195087.4

    申请日:2023-09-04

    发明人: SEKIYA, Ryota

    摘要: According to one arrangement, a radar system (10) includes a plurality of antennas, and a processor (13) configured to drive the antennas. In a case of driving the antennas in a first mode, the processor (13) is configured to cause the antennas to be cooperatively operated, and image an object (10a) based on radar echoes received by the antennas. In a case of driving the antennas in a second mode, the processor (13) is configured to cause a first antenna group (31a) to be cooperatively operated, image the object (10a) based on radar echoes received in the first antenna group (31a), cause a second antenna group (31b) to be cooperatively operated, and image the object (10a) based on radar echoes received in the second antenna group (31b). The second antenna group (31b) is different from the first antenna group (31a).

    INSPECTION SYSTEM AND INSPECTION METHOD
    4.
    发明公开

    公开(公告)号:EP4435671A1

    公开(公告)日:2024-09-25

    申请号:EP23212958.5

    申请日:2023-11-29

    发明人: SEKIYA, Ryota

    摘要: According to one arrangement, an inspection system includes a first measurement unit (22a) for measuring a target, a first determination unit (24a) for making a first determination on whether the target includes a predetermined object using a first machine learning model (26a) based on a measurement result by the first measurement unit (22a), a second measurement unit (22b) for measuring the target, a second determination unit (24b) for making a second determination on whether the target includes the predetermined object based on a measurement result by the second measurement unit (22b), and a processing unit (12) for generating first update data of the first machine learning model (26a) based on the second determination.

    ANTENNA DEVICE
    5.
    发明公开
    ANTENNA DEVICE 审中-实审

    公开(公告)号:EP4404385A1

    公开(公告)日:2024-07-24

    申请号:EP23189211.8

    申请日:2023-08-02

    摘要: According to one embodiment, an antenna device includes a first antenna and a second antenna. The first antenna includes a first substrate and a plurality of first elements. The first substrate includes a first face along a first direction and a second direction. The plurality of first elements are arranged along the second direction. The second antenna includes a second substrate and a plurality of second elements. The second substrate includes a second face along the first direction and a third direction. The plurality of second elements are arranged along the third direction. The third direction crosses a plane including the first direction and the second direction. One of the plurality of first elements overlaps the second substrate in the third direction.