公开(公告)号：EP2677328A1

公开(公告)日：2013-12-25

申请号：EP13185427.5

申请日：2007-02-19

申请人： Mentor Graphics Corporation

发明人： Mrugalski, Grzegorz ,  Rajski, Janusz ,  Tyszer, Jerzy ,  Cheng, Wu-tung ,  Mukherjee, Nilanjan ,  Kassab, Mark

IPC分类号： G01R31/3185 ,  G06F11/267

CPC分类号： G01R31/3177 ,  G01R31/2851 ,  G01R31/31723 ,  G01R31/31727 ,  G01R31/318547 ,  G01R31/318563 ,  G01R31/318566

摘要： Disclosed herein are exemplary embodiments of a so-called "X-press" test response compactor. Certain embodiments of the disclosed compactor comprise an overdrive section and scan chain selection logic. Certain embodiments of the disclosed technology offer compaction ratios on the order of 1000x. Exemplary embodiments of the disclosed compactor can maintain about the same coverage and about the same diagnostic resolution as that of conventional scan-based test scenarios. Some embodiments of a scan chain selection scheme can significantly reduce or entirely eliminate unknown states occurring in test responses that enter the compactor. Also disclosed herein are embodiments of on-chip comparator circuits and methods for generating control circuitry for masking selection circuits.

摘要翻译： 这里公开了所谓的“X-press”测试响应压实机的示例性实施例。 所公开的压实机的某些实施例包括过驱动部分和扫描链选择逻辑。 所公开技术的某些实施例提供约1000x的压实比。 所公开的压实机的示例性实施例可以保持与常规的基于扫描的测试场景相同的覆盖范围和大致相同的诊断分辨率。 扫描链选择方案的一些实施例可以显着地减少或完全消除在进入压实机的测试响应中发生的未知状态。 本文还公开了片上比较器电路和用于产生用于屏蔽选择电路的控制电路的方法的实施例。

公开(公告)号：EP2677328B1

公开(公告)日：2015-07-29

申请号：EP13185427.5

申请日：2007-02-19

申请人： Mentor Graphics Corporation

发明人： Mrugalski, Grzegorz ,  Rajski, Janusz ,  Tyszer, Jerzy ,  Cheng, Wu-tung ,  Mukherjee, Nilanjan ,  Kassab, Mark

IPC分类号： G01R31/3185 ,  G06F11/267 ,  G01R31/3177

CPC分类号： G01R31/3177 ,  G01R31/2851 ,  G01R31/31723 ,  G01R31/31727 ,  G01R31/318547 ,  G01R31/318563 ,  G01R31/318566

摘要： Disclosed herein are exemplary embodiments of a so-called "X-press" test response compactor. Certain embodiments of the disclosed compactor comprise an overdrive section and scan chain selection logic. Certain embodiments of the disclosed technology offer compaction ratios on the order of 1000x. Exemplary embodiments of the disclosed compactor can maintain about the same coverage and about the same diagnostic resolution as that of conventional scan-based test scenarios. Some embodiments of a scan chain selection scheme can significantly reduce or entirely eliminate unknown states occurring in test responses that enter the compactor. Also disclosed herein are embodiments of on-chip comparator circuits and methods for generating control circuitry for masking selection circuits.