Wafer rotary holding apparatus and wafer surface treatment apparatus with waste liquid recovery mechanism

    公开(公告)号:EP1083589A2

    公开(公告)日:2001-03-14

    申请号:EP00119294.7

    申请日:2000-09-06

    IPC分类号: H01L21/00

    摘要: Provided is a wafer rotary holding apparatus by which a reduced pressure is created on an upper surface of a rotary disk by a simple and easy-to-make mechanism with no need of any of a vacuum source apparatus, a compressed air supply apparatus, a compressed gas supply apparatus and other apparatuses in use; a wafer can be held while rotating with no contact to a rear surface thereof; a degree of pressure reduction can be adjusted with ease and even a thin wafer (of 0.1 mm or less in thickness) can be held while rotating with no deformation; and the wafer with a bowing can be held while rotating with no correction of the bowing. A wafer rotary holding apparatus includes: a rotary disk on which a fluid flow path is formed; a through hole formed in a central section of the rotary disk; and a plurality of wafer rests provided on an upper surface of the rotary disk.

    摘要翻译: 提供一种晶片旋转保持装置,其通过简单且易于制造的机构在旋转盘的上表面上产生减压,而不需要任何真空源装置,压缩空气供应装置, 压缩气体供给装置等使用中的装置; 可以在不与其后表面接触的同时旋转晶片; 可以容易地调节减压度,并且即使在没有变形的同时旋转的同时也能够保持薄的晶片(厚度为0.1mm以下) 并且具有弯曲的晶片可以在没有弯曲的校正的同时旋转的同时保持。 晶片旋转保持装置包括:旋转盘,其上形成有流体流路; 形成在旋转盘的中心部的通孔; 以及设置在旋转盘的上表面上的多个晶片托架。

    Wafer rotary holding apparatus and wafer surface treatment apparatus with waste liquid recovery mechanism
    2.
    发明公开
    Wafer rotary holding apparatus and wafer surface treatment apparatus with waste liquid recovery mechanism 有权
    us us us us us us us us us us us us us us us us us us us us us us us us us us

    公开(公告)号:EP1083589A3

    公开(公告)日:2006-03-01

    申请号:EP00119294.7

    申请日:2000-09-06

    IPC分类号: H01L21/00

    摘要: Provided is a wafer rotary holding apparatus by which a reduced pressure is created on an upper surface of a rotary disk by a simple and easy-to-make mechanism with no need of any of a vacuum source apparatus, a compressed air supply apparatus, a compressed gas supply apparatus and other apparatuses in use; a wafer can be held while rotating with no contact to a rear surface thereof; a degree of pressure reduction can be adjusted with ease and even a thin wafer (of 0.1 mm or less in thickness) can be held while rotating with no deformation; and the wafer with a bowing can be held while rotating with no correction of the bowing. A wafer rotary holding apparatus includes: a rotary disk on which a fluid flow path is formed; a through hole formed in a central section of the rotary disk; and a plurality of wafer rests provided on an upper surface of the rotary disk.

    摘要翻译: 提供一种晶片旋转保持装置,其通过简单且易于制造的机构在旋转盘的上表面上产生减压,而不需要任何真空源装置,压缩空气供应装置, 压缩气体供给装置等使用中的装置; 可以在不与其后表面接触的同时旋转晶片; 可以容易地调节减压度,并且即使在没有变形的同时旋转的同时也能够保持薄的晶片(厚度为0.1mm以下) 并且具有弯曲的晶片可以在没有弯曲的校正的同时旋转的同时保持。 晶片旋转保持装置包括:旋转盘,其上形成有流体流路; 形成在旋转盘的中心部的通孔; 以及设置在旋转盘的上表面上的多个晶片托架。