公开(公告)号：EP2138852A1

公开(公告)日：2009-12-30

申请号：EP08739875.6

申请日：2008-04-04

Applicant: NHK Spring Co., Ltd.

Inventor： HIRONAKA, Kohei ,  NAKAMURA, Toru ,  KONDO, Mitsuhiro

IPC: G01R1/073 ,  G01R31/26

CPC classification number: G01R1/0458 ,  G01R1/0466 ,  G01R1/0483 ,  G01R31/2874

Abstract: Provided are a conductive contact holder and a conductive contact unit that enable a test to be performed in a precise temperature environment. For this objective, a construction includes a holder substrate (4) that individually receives plural conductive contacts, and a floating member (5) attached to the holder substrate (4) such that a distance from a surface of the holder substrate (4) is varied within a predetermined range by an external force. The floating member has plural hole sections into which a front end section of each of the conductive contacts (2) received in the holder substrate (4) is inserted. A gap (Sp) between the holder substrate (4) and the floating member (5) forms at least a part of a passage of fluid introduced from outside of the conductive contact holder.

Abstract translation: 提供了一种能够在精确的温度环境下进行测试的导电触点支架和导电触点单元。 为此目的，一种结构包括一个单独容纳多个导电接点的支架基板（4）和一个安装在支架基板（4）上的浮动元件（5），使得与支架基板（4）表面的距离为 通过外力在预定范围内变化。 浮动构件具有多个孔部分，容纳在保持器基板（4）中的每个导电触点（2）的前端部插入该多个孔部分中。 保持基板（4）与浮动部件（5）之间的间隙（Sp）形成从导电性触头支架的外部导入的流体的流路的至少一部分。

公开(公告)号：EP2360482A1

公开(公告)日：2011-08-24

申请号：EP09829133.9

申请日：2009-11-26

Applicant: NHK Spring Co., Ltd.

Inventor： KAZAMA, Toshio ,  HIRONAKA, Kohei ,  KONDO, Mitsuhiro ,  ITO, Osamu

IPC: G01R1/073 ,  G01R31/26 ,  H01R33/76

CPC classification number: G01R1/07378 ,  G01R1/0466 ,  G01R1/0483 ,  G01R1/06722 ,  G01R3/00 ,  H01R13/2421

Abstract: A probe-unit base member having high rigidity and requiring no troublesome operations for its manufacture and a probe unit are provided. To achieve the purpose, the probe-unit base member includes a conductive substrate 41 that has a first opening 41a capable of fitting therein a probe holder 3 and a second opening 41b communicated with the first opening 41a; a coating 42 that is made of an insulating adhesive agent and is coated at least on an edge of the second opening 41b; and an insulating guide member 43 that is bonded to the edge of the second opening 41b through the coating 42 and guides one of two contact bodies to a position in contact with probes 2.

Abstract translation: 提供具有高刚性并且不需要麻烦的制造操作的探针单元底座部件和探针单元。 为了达到上述目的，探针单元基部件包括导电基板41，该导电基板41具有能够嵌入探针支架3的第一开口41a和与第一开口41a连通的第二开口41b; 涂层42，其由绝缘粘合剂制成并且至少涂覆在第二开口41b的边缘上; 以及通过涂层42接合到第二开口41b的边缘并将两个接触体中的一个引导到与探针2接触的位置的绝缘引导构件43。