Abstract:
To prevent reduction in current-carrying capacity due to a reduced diameter of a probe, a probe unit includes the followings: a plurality of large diameter probes; a plurality of small diameter probes having diameters smaller than those of the large diameter probes; a large-diameter probe holder that includes a plurality of large hole portions which individually hold the large diameter probes, and a plurality of reception hole portions which have diameters smaller than those of the large hole portions, communicate with any one of the large hole portions, and receive end portions of the small diameter probes so that the end portions come into contact with the large diameter probes, while a set of the large hole portion and the reception hole portion that communicate with each other pierces through the large-diameter probe holder in a thickness direction; and a small-diameter probe holder that includes a plurality of small hole portions which individually hold the small diameter probes while preventing the small diameter probes from coming off and which pierce through the small-diameter probe holder, and that is stacked on the large-diameter probe holder so that each small hole portion communicates with any one of the reception hole portions. The central axes in a longitudinal direction of the large hole portion and the small hole portion that communicate with each other are separated from each other, and the small hole portions include two small hole portions which are adjacent to each other and of which central axes are separated from each other by a distance shorter than a distance between the central axes of two large hole portions that are corresponding to the two small hole portions.
Abstract:
A fastening member includes a first alloy portion and a second alloy portion. The first alloy portion is made of an aluminum alloy including 0.005 wt% to 5.0 wt% zinc and 0.6 wt% to 2.0 wt% magnesium and is provided to a part that comes into contact with at least one of a plurality of members serving as a fastening target. The second alloy portion is made of an aluminum alloy including more than 2.0 wt% and 5.0 wt% or less magnesium and more than 5.0 wt% and 10 wt% or less zinc and is joined to the first alloy portion.
Abstract:
In order for a conduction path to have a reduced number of sliding portions for conduction, without increase in inductance nor resistance, thereby permitting an enhanced accuracy of inspection, a pair of plungers (3, 4) biased in opposite directions by a coil spring (2), to be electrically connected to a wiring plate (10), have electrical connections in which, in a tubular portion (15) as a tight wound spiral portion (15a) fixed on one plunger (4) to allow linear flow of electrical signal, the other plunger (3) is brought into slidable contact.
Abstract:
A fastening member according to the present invention includes: a first alloy section made of aluminum alloy containing zinc in an amount of 0.005 wt% or more and 6.5 wt% or less and containing magnesium in an amount of 0.6 wt% or more and 2.0 wt% or less, and provided at a portion being in contact with at least one of the plurality of members; and a second alloy section made of an aluminum alloy containing magnesium in an amount of greater than 0.2 wt% and 2.3 wt% or less and containing copper in an amount of greater than 1.0 wt% and 8.0 wt% or less, and bonded to the first alloy section.
Abstract:
A probe-unit base member having high rigidity and requiring no troublesome operations for its manufacture and a probe unit are provided. To achieve the purpose, the probe-unit base member includes a conductive substrate 41 that has a first opening 41a capable of fitting therein a probe holder 3 and a second opening 41b communicated with the first opening 41a; a coating 42 that is made of an insulating adhesive agent and is coated at least on an edge of the second opening 41b; and an insulating guide member 43 that is bonded to the edge of the second opening 41b through the coating 42 and guides one of two contact bodies to a position in contact with probes 2.
Abstract:
A wiring substrate that allows wiring at a fine pitch and has a coefficient of thermal expansion close to the coefficient of thermal expansion of silicone, and a probe card that includes the wiring substrate are provided. To this end, there are provided a wiring substrate that includes a ceramic substrate having a coefficient of thermal expansion of 3×10 -6 to 5×10 -6 /°C and one or more thin-film wiring sheets stacked on one surface of the ceramic substrate, and a probe head on which a plurality of conductive proves are arranged in accordance with wiring on the thin-film wiring sheet, which holds individual probes while preventing the probes from coming off and allowing both ends of each probe to be exposed, and which is stacked on the wiring substrate while one end of each probe is brought into contact with the thin-film wiring sheet.
Abstract:
To provide an easily manufactured conductive contact holder and a conductive contact unit capable of supporting a high frequency signal and a highly integrated and downsized inspection object, and a method of manufacturing the conductive contact holder. To achieve the object, there is provided a holder substrate made of a conductive material and having an opening for holding a conductive contact for inputting and outputting a signal to and from a circuit structure and a holding member formed by filling the opening with an insulating material, smoothing the surface of the insulating material, and forming a hole through the insulating material for inserting the conductive contact.