公开(公告)号：EP0431368B1

公开(公告)日：1994-07-27

申请号：EP90121936.0

申请日：1990-11-16

Applicant: NIRSYSTEMS INCORPORATED

Inventor： Honigs, David E.

IPC: G01J3/18

CPC classification number: G01J3/02 ,  G01J3/0205

公开(公告)号：EP0502495A1

公开(公告)日：1992-09-09

申请号：EP92103675.2

申请日：1992-03-04

Applicant: NIRSYSTEMS INCORPORATED

Inventor： Honigs, David E. ,  Kelly, Timothy G.

IPC: G01J3/06

CPC classification number: G01N21/274 ,  G01J3/28 ,  G01J3/42 ,  G01J2003/2879 ,  G01N2201/1283

Abstract: In a spectrophotometer having an oscillating grating (13), an automatic calibration system is provided to ensure that the instrument constants are recomputed before each measurement of an unknown sample. In the system, whenever a reference scan is carried out, a second scan through an absorbance standard is carried out automatically and the data obtained is used to correct the instrument coefficients relating the angular position of the grating to the wavelength. The corrected coefficients are then stored to be used in the measurement of the unknown sample immediately thereafter. For near infrared spectrum measurements, the absorbance standard is a polystyrene plate. For visual measurements, the absorbance standard is a didymium plate. The didymium plate is mounted on the polystyrene plates eclipse a portion of the polystyrene plate.

Abstract translation: 在具有振荡光栅（13）的分光光度计中，提供自动校准系统以确保在每个测量未知样品之前重新计算仪器常数。 在系统中，每当进行参考扫描时，通过吸光度标准进行第二扫描，并且所获得的数据用于校正与光栅的角位置相关的仪器系数与波长。 然后将校正后的系数存储在其后立即用于未知样品的测量。 对于近红外光谱测量，吸光度标准是聚苯乙烯板。 对于视觉测量，吸光度标准是mium板。 聚苯乙烯板上安装了钕铁板，将聚苯乙烯板的一部分。

公开(公告)号：EP0431368A3

公开(公告)日：1992-01-02

申请号：EP90121936.0

申请日：1990-11-16

Applicant: NIRSYSTEMS INCORPORATED

Inventor： Honigs, David E.

IPC: G01J3/18

CPC classification number: G01J3/02 ,  G01J3/0205

Abstract: An improved near infrared spectrophotometer is disclosed which reduces wave shift errors arising from hot spots in a light source. A ground quartz plate (21) uniformly diffuses radiation from the light source (12) to evenly illuminate the entrance slit (18) for a diffraction grating (20). Radiation emerges from the entrance slit with a uniform angular intensity distribution and is dispersed into a spectrum by a reflecting diffraction grating (20) towards an exit slit (26). A narrow wavelength band of radiation passes through the exit slit to illuminate a sample (28). Because the entrance slit is uniformly illuminated, without regard to variations in radiation intensity due to hot spots in the source, wave shift errors in the reflectivity measurements for the sample are reduced.

公开(公告)号：EP0431368A2

公开(公告)日：1991-06-12

申请号：EP90121936.0

申请日：1990-11-16

Applicant: NIRSYSTEMS INCORPORATED

Inventor： Honigs, David E.

IPC: G01J3/18

CPC classification number: G01J3/02 ,  G01J3/0205

Abstract: An improved near infrared spectrophotometer is disclosed which reduces wave shift errors arising from hot spots in a light source. A ground quartz plate (21) uniformly diffuses radiation from the light source (12) to evenly illuminate the entrance slit (18) for a diffraction grating (20). Radiation emerges from the entrance slit with a uniform angular intensity distribution and is dispersed into a spectrum by a reflecting diffraction grating (20) towards an exit slit (26). A narrow wavelength band of radiation passes through the exit slit to illuminate a sample (28). Because the entrance slit is uniformly illuminated, without regard to variations in radiation intensity due to hot spots in the source, wave shift errors in the reflectivity measurements for the sample are reduced.

Abstract translation: 公开了一种改进的近红外分光光度计，其减少了由光源中的热点引起的波移误差。 地面石英板（21）均匀地扩散来自光源（12）的辐射，以均匀地照射用于衍射光栅（20）的入口狭缝（18）。 辐射从入口狭缝中以均匀的角度强度分布出现，并通过反射衍射光栅（20）朝向出射狭缝（26）分散到光谱中。 窄的波长带辐射通过出口狭缝照射样品（28）。 由于入口狭缝均匀照明，不考虑由于源中的热点引起的辐射强度的变化，样品的反射率测量中的波移误差降低。