专利检索 ap:("Nirox S.r.l.") AND inv:"PASQUALI, Andrea" 第 1 页

1.

发明授权
METHOD AND INSTRUMENT FOR OPTICAL THICKNESS MEASUREMENT OF TRANSPARENT OR SEMITRANSPARENT MATERIALS 有权
标题翻译：方法和手段光学厚度测量透明或半透明的材料

公开(公告)号：EP2394135B1

公开(公告)日：2013-11-27

申请号：EP10711724.4

申请日：2010-02-04

申请人： Nirox S.r.l.

发明人： BANDERA, Andrea , DONINI, Maurizio , PASQUALI, Andrea

IPC分类号： G01B11/06 , G01B9/02

CPC分类号： G01B11/0625 , G01B9/02021 , G01B9/02044 , G01B9/02083 , G01B9/0209 , G01B11/0691

2.

发明公开
APPARATUS AND METHOD OF MEASURING THE INNER DIAMETER OF A TUBE ALONG THE RESPECTIVE PRODUCTION LINE 审中-公开

公开(公告)号：EP4007887A1

公开(公告)日：2022-06-08

申请号：EP20758349.3

申请日：2020-07-31

申请人： Nirox S.r.l.

发明人： BANDERA, Andrea , DONINI, Maurizio , PASQUALI, Andrea

IPC分类号： G01B11/12 , G01B11/10 , G01B11/06

3.

发明公开
METHOD AND INSTRUMENT FOR OPTICAL THICKNESS MEASUREMENT OF TRANSPARENT OR SEMITRANSPARENT MATERIALS 有权
标题翻译：方法和手段光学厚度测量透明或半透明的材料

公开(公告)号：EP2394135A2

公开(公告)日：2011-12-14

申请号：EP10711724.4

申请日：2010-02-04

申请人： Nirox S.r.l.

发明人： BANDERA, Andrea , DONINI, Maurizio , PASQUALI, Andrea

IPC分类号： G01B11/06

CPC分类号： G01B11/0625 , G01B9/02021 , G01B9/02044 , G01B9/02083 , G01B9/0209 , G01B11/0691

摘要： This invention concerns a method and an instrument for optical measuring of the thickness of materials in form of transparent or semitransparent film which comprises in combination optical lighting components, signal receiving components, control and supervisor components, all integrated and contained in a sole body. The measuring instrument is as a whole applicable to a production line of the material that has to be measured, both in fixed and dynamic position, is interfaced with remote display interface and could be interfaced and interact with a possible control system of the operating of the production line it is connected with.