摘要:
The present invention provides an X-ray backscattering safety inspection system, comprising: an X-ray source comprising a plurality of target spots each individually controllable to emit X-rays; collimators configured to be respectively passed through the X-ray emitted from the plurality of target spots and output N pencil-shaped X-ray beams, and the N pencil-shaped X-ray beams are irradiated onto N locations of an object to be inspected; and N detectors configured to respectively receive scattering signals from the corresponding locations of the object to be inspected, in which N is a positive integer that is great than or equal to 2. The system may achieve double scannings in one scanning operation, which not only increases scanning speed but also enhances backscattering signal for imaging.
摘要:
The present disclosure provides a human body security inspection apparatus, comprising: a base on which an inspected human stands; a millimeter-wave transceiver configured to perform a millimeter-wave scanning operation on the body of the inspected human standing on the base so as to detect whether or not the inspected human carries contraband and output a first signal; and a metal sensing detector arranged within the base and configured to detect whether or not there is a metallic foreign object in underside of a shoe of the inspected human and output a second signal.
摘要:
The present disclosure provides a human body security inspection apparatus, comprising: a base on which an inspected human stands; a millimeter-wave transceiver configured to perform a millimeter-wave scanning operation on the body of the inspected human standing on the base so as to detect whether or not the inspected human carries contraband and output a first signal; and a metal sensing detector arranged within the base and configured to detect whether or not there is a metallic foreign object in underside of a shoe of the inspected human and output a second signal.
摘要:
The present disclosure provides an X-ray backscattering safety inspection system, comprising: one or more backscattering inspection subsystem configured to inspect an object to be inspected by emitting X-ray beams towards the object to be inspected and inspecting scattering signals; and a control subsystem configured to adjust a distance between the backscattering inspection subsystem and locations on a side of the object to be inspected where are irradiated by the X-ray beams in real time according to a size of the object to be inspected such that the scattering signals inspected are optimized. The system may be adapted to objects to be inspected with different sizes or shapes while enhancing backscattering signals for imaging.