公开(公告)号：EP0857305A1

公开(公告)日：1998-08-12

申请号：EP96934251.0

申请日：1996-10-22

申请人： Opmaxx Inc.

发明人： ARABI, Karim ,  KAMINSKA, Bozena

IPC分类号： G01R31

CPC分类号： G01R31/31707 ,  G01R31/2824 ,  G01R31/2851 ,  G01R31/3167

摘要： The oscillation-based test method and device is applied to at least partially analog circuits. The at least partially analog circuit is first divided into building blocks each having a given structure. Each building block is then inserted into an oscillator circuit to produce an output signal having an oscillation frequency related to the structure of the building block under test. The oscillation frequency is then measured and a fault in the building block under test is detected when the measured oscillation frequency deviates from a given, nominal frequency. Experiments have demonstrated that the frequency deviation enables the detection of catastrophic and/or parametric faults, and ensures a high fault coverage. In this new time-domain test method, a single output frequency is evaluated for each building block whereby the test duration is very short. These characteristics make the test strategy very attractive for wafer-probe testing as well as final production testing.