公开(公告)号：EP2638407B1

公开(公告)日：2015-06-03

申请号：EP11782130.6

申请日：2011-11-10

申请人： ST-Ericsson SA

发明人： KUENEN, Jeroen

IPC分类号： G01R31/317 ,  G01R27/26 ,  H03L7/00

CPC分类号： G01R23/00 ,  G01R23/09 ,  G01R27/04 ,  G01R27/2605 ,  G01R27/32 ,  G01R31/2824 ,  G01R31/31727 ,  H03L7/099 ,  H03L2207/50

公开(公告)号：EP2638407A1

公开(公告)日：2013-09-18

申请号：EP11782130.6

申请日：2011-11-10

申请人： ST-Ericsson SA

发明人： KUENEN, Jeroen

IPC分类号： G01R31/317 ,  G01R27/26 ,  H03L7/00

CPC分类号： G01R23/00 ,  G01R23/09 ,  G01R27/04 ,  G01R27/2605 ,  G01R27/32 ,  G01R31/2824 ,  G01R31/31727 ,  H03L7/099 ,  H03L2207/50

摘要： Systems provide for a test system for capacitors in a digitally controllable oscillator (DCO). The system includes: capacitor toggling logic configured to switch on and off a selected one of the capacitors at a modulation frequency; a tone generator configured to generate a tone; a mixer configured to receive the tone and an output carrier signal from the DCO while the capacitor toggling logic is switching the selected one of the capacitors on and off and to output an intermediate frequency signal having FM sidebands based on the modulation frequency and relative capacitor size; and an evaluation circuit configured to evaluate a frequency deviation associated with the selected one of the capacitors based on at least one of the FM sidebands.

公开(公告)号：EP1777532A1

公开(公告)日：2007-04-25

申请号：EP05022703.2

申请日：2005-10-18

申请人： Delphi Technologies, Inc.

发明人： Hildebrand, Carsten ,  Ioffe, Alexander, Dr.

IPC分类号： G01R29/10 ,  G01R31/28 ,  B60R25/00

CPC分类号： H01Q1/3241 ,  B60R25/24 ,  G01R29/10 ,  G01R31/2824

摘要： Die Erfindung betrifft ein Prüfverfahren für eine Antenne, bei dem eine Spannung mit variierender Frequenz an die Antenne angelegt wird und frequenzabhängig die Amplitude des in Antwort darauf fließenden Stromes gemessen wird. Zur Feststellung der Funktionstüchtigkeit und/oder der Lage und/oder des Aufbaus der Antenne wird die Frequenzabhängigkeit der Amplitude des Stromes oder wenigstens ein daraus abgeleiteter Parameter ausgewertet. Die Erfindung betrifft weiterhin eine Treibereinrichtung zur Durchführung eines erfindungsgemäßen Verfahrens und einer Antenne mit einer erfindungsgemäßen Treibereinrichtung.

摘要翻译： 该方法包括向天线施加具有变化频率的电压，测量响应中流动的电流的振幅的频率依赖性，并且评估当前或至少一个导出参数的振幅的频率依赖性以确定效率;以及 /或天线的位置和/或结构。 还包括以下独立权利要求：（A）用于天线的驾驶员（B）天线（C）以及驾驶员和天线的使用或用于机动车辆访问和/或授权系统的本发明的方法。

公开(公告)号：EP3002875A1

公开(公告)日：2016-04-06

申请号：EP15186934.4

申请日：2015-09-25

申请人： Samsung Electronics Co., Ltd.

发明人： HONG, Sang-min ,  LEE, Sang-keun

IPC分类号： H03J7/04 ,  H04N5/12 ,  H04B17/20

CPC分类号： H04L27/152 ,  G01R31/2824 ,  H03J7/04 ,  H03J2200/09 ,  H04L41/22 ,  H04N5/126

摘要： An error detector and a method for detecting an error of an oscillator are provided. The error detector includes a receiver that receives an oscillation signal of an oscillator and a reference signal; and a controller that changes the oscillation signal within a frequency range so as to correspond to the reference signal and decides whether an error is generated in the oscillator based on the changed oscillation signal.

摘要翻译： 提供了用于检测振荡器的误差的误差检测器和方法。 误差检测器包括接收振荡器的振荡信号和参考信号的接收机; 以及控制器，其将频率范围内的振荡信号改变为与参考信号相对应，并且基于改变的振荡信号来决定是否在振荡器中产生误差。

公开(公告)号：EP2958231A1

公开(公告)日：2015-12-23

申请号：EP15172057.0

申请日：2015-06-15

申请人： Renesas Electronics Corporation

发明人： OZAWA, Osamu ,  NISHIOKA, Soshiro ,  NAKAMURA, Takashi ,  ABE, Susumu ,  TANIGUCHI, Kazuya ,  TANIMURA, Masaaki

IPC分类号： H03B5/36 ,  G01R31/28

CPC分类号： H03B5/36 ,  G01R31/2824 ,  H03B5/366 ,  H03B2200/005 ,  H03B2201/0266 ,  H03L7/00

摘要： A semiconductor integrated circuit device having a function to perform oscillation in combination with a crystal oscillator, includes: a first impedance element including a first external terminal coupled to one terminal of the crystal oscillator, a second external terminal coupled to the other terminal of the crystal oscillator, and first and second terminals coupled to the first and second external terminals when the oscillation is performed; a first variable capacitance circuit coupled to the first terminal of the feedback impedance element, and a configuration circuit for setting a capacitance value of the first variable capacitance circuit. A measurement signal is supplied to the second terminal of the feedback impedance element, and in response to this, the capacitance value of the first variable capacitance circuit is set by the configuration circuit based on the delay time of an observation signal generated at the first terminal with respect to the measurement signal.

摘要翻译： 具有结合的晶体振荡器进行振荡的功能的半导体集成电路器件，包括：第一阻抗元件，其包括耦合到所述晶体振荡器的一个端子，耦合到所述晶体的另一端子的第二外部端子的第一外部端子 振荡器，以及耦合到所述第一和第二外部端子当振荡进行第一和第二端子; 第一可变电容电路，其耦合到所述反馈阻抗元件的第一端，和用于设置所述第一可变电容电路的电容值的配置电路。 的测量信号被提供给反馈阻抗元件的第二端，并且响应于此，所述第一可变电容电路的电容值是基于在所述第一终端产生的观测信号的延迟时间由配置电路设置 相对于所述测量信号。

公开(公告)号：EP2338066A1

公开(公告)日：2011-06-29

申请号：EP09782155.7

申请日：2009-08-25

申请人： Robert Bosch GmbH

发明人： DROTLEFF, Hans-Georg

IPC分类号： G01R31/28 ,  G01R23/15

CPC分类号： G01R31/2824 ,  G01R23/155

摘要： The invention relates to a method and to a device for inspecting a frequency-modulated pulse generator (1), the device comprising: a cycle counting unit (5, 24) for counting pulse cycles (f_SSO) of the pulse generator (1, 17, 34) in multiple successive measurement time frames (T_m) particularly defined by a measurement signal (m) having a measurement frequency (f_m), and for outputting cycle counts (z), and a comparison unit (6, 7, 8) for receiving and comparing the cycle counts (z) to each other and for outputting at least one output signal (S2, S6) as a function of the comparison. For this purpose detected maximum and minimum values may be compared to each other.

公开(公告)号：EP0964522A1

公开(公告)日：1999-12-15

申请号：EP99111375.4

申请日：1999-06-10

申请人： Murata Manufacturing Co., Ltd.

发明人： Hirano, Yasuhiko ,  Ieki, Tsutomu ,  Tanaka, Hiroaki

IPC分类号： H03L1/04 ,  H03B5/32

CPC分类号： G01R31/2824 ,  G07C9/00182 ,  G07C2009/00793 ,  H03B5/326 ,  H03B5/362 ,  H03B5/364

摘要： An oscillator module (20) in which external wires can be reduced, and characteristics of a resonator and oscillation margin can be measured. A circuit portion (21) for oscillation and a two-port surface acoustic wave resonator (26) are sealed in a package (27), one of the terminals of the two-port surface acoustic wave resonator is connected inside the package (27) to an input terminal (28, 29) of the circuit portion (21) for oscillation. The number of external terminals (28, 29, 30, 31) provided at the package (27) is reduced, enabling the oscillator module (20) to be made small-scale and at lower cost. Furthermore, it is possible to measure the insertion loss and resonant frequency of the two-port surface acoustic wave resonator (26), and the oscillation margin of the oscillator module (20), making it possible to improve the yield of the oscillator and reduce costs.

摘要翻译： 可以减少外部线的振荡器模块（20），并且可以测量谐振器的特性和振荡裕度。 用于振荡的电路部分（21）和双端口声表面波谐振器（26）被密封在封装（27）中，两端口声表面波谐振器的一个端子连接在封装（27）内， 到用于振荡的电路部分（21）的输入端（28,29）。 设置在封装（27）处的外部端子（28,29,30,31）的数量减少，使得振荡器模块（20）能够以较小的成本进行制造。 此外，可以测量双端口声表面波谐振器（26）的插入损耗和谐振频率以及振荡器模块（20）的振荡裕度，使得可以提高振荡器的产量并减小 成本。

公开(公告)号：EP0760954B1

公开(公告)日：2003-07-23

申请号：EP95919278.2

申请日：1995-05-25

申请人： POSEIDON SCIENTIFIC INSTRUMENTS PTY. LTD. ,  THE UNIVERSITY OF WESTERN AUSTRALIA

发明人： WOODE, Richard, Alec, Univ. of Western Australia ,  TOBAR, Michael, Edmund, Univ. of Western Austrilia ,  IVANOV, Eugene, Nikolay, Univ. of W. Australia

IPC分类号： G01R29/26 ,  H03B1/00 ,  H03B5/30 ,  H04B15/00 ,  H03D13/00 ,  H03B5/18

CPC分类号： H03B5/18 ,  G01R29/26 ,  G01R31/2824 ,  H03B2202/027 ,  H03B2202/076

摘要： A phase noise detector for a signal having a carrier frequency, comprising a frequency discriminator producing a dispersed signal from the signal and a phase detector means (28) responsive to the carrier frequency in the signal and to a carrier suppressed signal to produce an output signal corresponding to the noise close to the carrier frequency in the signal, the carrier suppressed signal being produced by a carrier suppression means (30) responsive to two input signals, the input signals corresponding to the signal, one of the input signals being the dispersed signal.

公开(公告)号：EP1130407A2

公开(公告)日：2001-09-05

申请号：EP01104884.0

申请日：2001-02-28

申请人： Murata Manufacturing Co., Ltd.

发明人： Yoshida, Norio ,  Watanabe, Takahiro ,  Ito, Tomonori

IPC分类号： G01R31/02

CPC分类号： G01R31/2822 ,  G01R31/2818 ,  G01R31/2824

摘要： A high frequency component is disclosed in which the characteristics of a high frequency circuit that cannot be measured only by an outwardly led-out terminal electrode can be easily measured at the final-product stage. In the high frequency component, on a substrate (1) there is formed an electrode pattern including a signal measuring electrode pad (3). Additionally, chip components are mounted on the substrate (1). A metal cover (2) has a hole (4) formed near the signal measuring electrode pad (3). Through the hole (4), a probe of a measuring apparatus is inserted from the outside to abut with the electrode pad (3). With the arrangement, a voltage signal obtained at a predetermined point of the high frequency circuit can be measured.

摘要翻译： 高频分量是圆盘游离缺失，其中，高频电路的特性并不能仅仅通过在表面上看引出端子电极测量，可在最终产品阶段容易地测量。 在高频分量，在一个（1）上形成电极图案包括信号测量电极垫（3）的基板。 此外，芯片部件安装在基板（1）。 的金属盖（2）具有孔（4）的信号测量电极焊盘附近形成（3）。 通过孔（4），测量装置的探头被从外部插入到邻接与电极焊盘（3）。 根据上述结构，在高频电路的预定点而得到的电压信号可以被测量。

公开(公告)号：EP0857305A1

公开(公告)日：1998-08-12

申请号：EP96934251.0

申请日：1996-10-22

申请人： Opmaxx Inc.

发明人： ARABI, Karim ,  KAMINSKA, Bozena

IPC分类号： G01R31

CPC分类号： G01R31/31707 ,  G01R31/2824 ,  G01R31/2851 ,  G01R31/3167

摘要： The oscillation-based test method and device is applied to at least partially analog circuits. The at least partially analog circuit is first divided into building blocks each having a given structure. Each building block is then inserted into an oscillator circuit to produce an output signal having an oscillation frequency related to the structure of the building block under test. The oscillation frequency is then measured and a fault in the building block under test is detected when the measured oscillation frequency deviates from a given, nominal frequency. Experiments have demonstrated that the frequency deviation enables the detection of catastrophic and/or parametric faults, and ensures a high fault coverage. In this new time-domain test method, a single output frequency is evaluated for each building block whereby the test duration is very short. These characteristics make the test strategy very attractive for wafer-probe testing as well as final production testing.