KUPPLUNGSEINRICHTUNG ZUR ÜBERTRAGUNG EINES MEDIUMS VON EINEM ORTSFESTEN TEIL AUF EIN DREHBARES TEIL
    2.
    发明公开
    KUPPLUNGSEINRICHTUNG ZUR ÜBERTRAGUNG EINES MEDIUMS VON EINEM ORTSFESTEN TEIL AUF EIN DREHBARES TEIL 有权
    离合装置,用于传输介质从静止部分可旋转部分

    公开(公告)号:EP2214863A1

    公开(公告)日:2010-08-11

    申请号:EP08805257.6

    申请日:2008-10-13

    申请人: Robert Bosch GmbH

    IPC分类号: B23Q1/00

    CPC分类号: B23Q1/0018

    摘要: The present invention relates to a coupling unit for transferring a medium from a stationary component to a rotating component, comprising a first stationary ring (7) attached to a stationary part (3), a second rotary ring (8) attached to a rotary part (4) and rotating together with the rotary part (4), a bearing (9) disposed between the first ring (7) and the second ring (8), a ring gap (10) disposed between the first ring (7) and the second ring (8), an inlet line (11) disposed on the first ring (7) for feeding the medium, an outlet line (12) disposed on the second ring (8) for transporting the medium, wherein the outlet line (12) rotates with the second ring (8), an inner sealing element (13) sealing the ring gap (10) on a radially inner side, and an outer sealing element (14) sealing the ring gap (10) on a radially outer side.

    VORRICHTUNG UND VERFAHREN ZUR FORMMESSUNG VON FREIFORM-FLÄCHEN
    3.
    发明公开
    VORRICHTUNG UND VERFAHREN ZUR FORMMESSUNG VON FREIFORM-FLÄCHEN 有权
    DEVICE AND METHOD FOR自由曲面的形状测量

    公开(公告)号:EP2153166A1

    公开(公告)日:2010-02-17

    申请号:EP08736008.7

    申请日:2008-04-09

    申请人: Robert Bosch GmbH

    IPC分类号: G01B11/24 G01B11/00

    摘要: The invention relates to a device for measuring the shape of freeform surfaces of objects to be measured, said device comprising a point-measuring optical and/or interferometric scanning arm, which can be displaced along a predefined line, and a measurement beam focussed on the freeform surface to be measured. According to the invention, the scanning arm may rotate in at least one plane relative to its scanning point so that the measurement beam strikes the freeform surface to be measured perpendicularly or within an acceptance angle of the scanning arm.