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公开(公告)号：EP2756288A1
公开(公告)日：2014-07-23
申请号：EP12761954.2
申请日：2012-09-14
发明人： DREIBHOLZ, Joerg , FREITAG, Christian , JAECK, Thomas , PACHL, Rudolf , SCHMIDTCHEN, Elke , KETH, Ingrid , SCHWOEBEL, Wolfgang , SEELIG, Peter
IPC分类号： G01N21/86 , G01N33/487
CPC分类号： G01N35/00009 , G01N21/8483 , G01N33/48764 , G01N2035/00019
摘要： The invention relates to an analytical test tape (20), particularly for use in a test tape cassette (14), with a carrier tape that can be wound onto a spool and a plurality of test elements (24) distributed on the carrier tape in the longitudinal direction of the tape, said elements comprising a spreading fabric (30) for applying a body fluid and a reagent layer (36) thereunder for detecting an analyte in the body fluid, wherein the spreading fabric (30) is formed from fabric threads (44,46) crossed in a lattice shape. The invention proposes that the rigidity of the spreading fabric (30) is modified in certain areas.
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2.发明公开TESTELEMENT-ANALYSESYSTEM MIT HARTSTOFFBESCHICHTETEN KONTAKTFLÄCHEN 有权TESTELEMENT-ANALYSESYSTEM MIT HARTSTOFFBESCHICHTETENKONTAKTFLÄCHEN
公开(公告)号：EP1725881A2
公开(公告)日：2006-11-29
申请号：EP05715805.7
申请日：2005-03-08
IPC分类号： G01R1/00
CPC分类号： G01N27/26 , G01N33/4875
摘要： The invention relates to a test element analysis system (1) for analytical investigation of a sample, in particular a body fluid, comprising at least one test element (3) with one or more measuring zones (7), contact surfaces (11) located on the test element (3), in particular, electrodes or conductors, whereby the sample under investigation is applied to the measuring zone (7) to perform an analysis by determination of a parameter characteristic for the analysis, and an analytical device (2) with a test element retainer (5) for positioning the test element (3) in a measuring position and a measuring device for measuring the characteristic change, whereby the test element retainer (5) comprises contact elements (14) with contact surfaces (12) which permit an electrical contact between the contact surfaces (11) of the test element (3) and the contact surfaces (12) of the test element retainer (5), characterised in that one of said contact surfaces is provided with an electrically-conducting hard material surface (20). The invention relates particularly to the coating of a contact surface (12) of the contact connection on a test element analysis device with an electrically-conducting hard material.
摘要翻译： 本发明涉及一种用于对样品，特别是体液的分析检查的测试元件分析系统，其包括至少一个具有一个或多个测量区域的测试元件和位于测试元件，特别是电极或导体路径上的接触区域 要检查的样品被带入测量区域以进行分析以确定用于分析的特征测量量，以及具有用于将测试元件定位在测量位置的测试元件保持器的评估仪器和用于 测量特性变化，所述测试元件保持器包含具有接触区域的接触元件，所述接触元件能够使所述测试元件的接触区域与所述测试元件保持器的接触区域之间的电接触，其特征在于，所述接触区域中的一个设置有 导电硬质材料表面。
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3.发明授权
公开(公告)号：EP1725881B1
公开(公告)日：2009-04-29
申请号：EP05715805.7
申请日：2005-03-08
IPC分类号： G01N33/487
CPC分类号： G01N27/26 , G01N33/4875
摘要： The invention relates to a test element analysis system for analytical investigation of a sample, in particular a body fluid, comprising at least one test element with one or more measuring zones, contact surfaces located on the test element, in particular, electrodes or conductors, whereby the sample under investigation is applied to the measuring zone to perform an analysis by determination of a parameter characteristic for the analysis and an analytical device with a test element retainer for positioning the test element in a measuring position and a measuring device for measuring the characteristic change, whereby the test element retainer comprises contact elements with contact surfaces which permit an electrical contact between the contact surfaces of the test element and the contact surfaces of the test element retainer, characterised in that one of said contact surfaces is provided with an electrically-conducting hard material surface. The invention relates particularly to the coating of a contract surface of the contact connection on a test element analysis device with an electrically-conducting hard material.
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4.发明授权SYSTEM AND METHOD FOR OPTICALLY IMAGING OBJECTS ON A DETECTION DEVICE BY MEANS OF A PINHOLE APERTURE 有权系统和方法的对象该检测元件的光学例证一个洞面板进行
公开(公告)号：EP1851680B1
公开(公告)日：2010-12-15
申请号：EP06701300.3
申请日：2006-01-19
发明人： DREIBHOLZ, Joerg , AUGSTEIN, Manfred , MACHO, Heinz , KASS, Uwe , FALK, Dieter
IPC分类号： G06K9/20
CPC分类号： G06K9/2036
摘要： The invention describes systems and methods for optically imaging objects and in particular optical patterns or codes onto a detection device by means of a pinhole aperture. According to the invention these systems have optical attenuation elements between the illumination devices and the object which substantially compensate the system-inherent imaging defects caused by the pinhole aperture and in particular the system-inherent peripheral decrease in brightness of an image of the object formed by a pinhole aperture on the detection device. According to the invention the optical attenuation elements change the illumination intensity of the object in such a manner that the central areas of the object are illuminated at a lower light intensity than its peripheral areas. As a result of the subsequent imaging of the object by means of a pinhole aperture, the central areas of the object are imaged onto the detection device at a higher light intensity than the peripheral areas of the object. The superimposition of the two effects enables the imaging system according to the invention to achieve a substantially uniform system-inherent brightness distribution on the detection device.
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5.发明公开SYSTEM AND METHOD FOR OPTICALLY IMAGING OBJECTS ON A DETECTION DEVICE BY MEANS OF A PINHOLE APERTURE 有权系统和方法的对象该检测元件的光学例证一个洞面板进行
公开(公告)号：EP1851680A2
公开(公告)日：2007-11-07
申请号：EP06701300.3
申请日：2006-01-19
发明人： DREIBHOLZ, Joerg , AUGSTEIN, Manfred , MACHO, Heinz , KASS, Uwe , FALK, Dieter
IPC分类号： G06K9/20
CPC分类号： G06K9/2036
摘要： The invention describes systems and methods for optically imaging objects and in particular optical patterns or codes onto a detection device by means of a pinhole aperture. According to the invention these systems have optical attenuation elements between the illumination devices and the object which substantially compensate the system-inherent imaging defects caused by the pinhole aperture and in particular the system-inherent peripheral decrease in brightness of an image of the object formed by a pinhole aperture on the detection device. According to the invention the optical attenuation elements change the illumination intensity of the object in such a manner that the central areas of the object are illuminated at a lower light intensity than its peripheral areas. As a result of the subsequent imaging of the object by means of a pinhole aperture, the central areas of the object are imaged onto the detection device at a higher light intensity than the peripheral areas of the object. The superimposition of the two effects enables the imaging system according to the invention to achieve a substantially uniform system-inherent brightness distribution on the detection device.
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