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19 条记录 (耗时 0.012 秒)

    Reteachable non-contact switching circuit
    2.
    发明授权
    Reteachable non-contact switching circuit 有权

    公开(公告)号：EP2320284B1

    公开(公告)日：2018-05-30

    申请号：EP10189735.3

    申请日：2010-11-02

    申请人： Rockwell Automation Technologies, Inc.

    发明人： Foster, Wayne R. ,  Vavra, Joshua D. ,  Tambeau, Steven R.

    IPC分类号： G05B19/042

    CPC分类号： G05B1/00 ,  G07C3/00 ,  G08B21/18

    摘要： A method for reteaching a switching circuit is provided. The method includes presenting a target within a sensing range of a sensor of the switching circuit for a pre-determined duration and acquiring an identification code of the target via the sensor. The method also includes comparing the acquired identification code with all stored identification codes of other targets previously used by the switching circuit as a basis for switching and reteaching the switching circuit for switching based on the acquired identification code if the acquired identification code is different from all stored identification codes previously used by the switching circuit as a basis for switching.

    System to test performance of pixels in a sensor array
    3.
    发明公开
    System to test performance of pixels in a sensor array 审中-公开
    用于测试传感器阵列中像素性能的系统

    公开(公告)号：EP2632166A3

    公开(公告)日：2017-05-24

    申请号：EP13156161.5

    申请日：2013-02-21

    申请人： Rockwell Automation Technologies, Inc.

    发明人： Grinberg, Anatoly G. ,  Foster, Wayne R.

    IPC分类号： H04N17/00 ,  H04N5/367

    摘要： A system to test operation of an optical sensor (50) is disclosed. The optical sensor (50) includes one or more photosensitive devices (80) configured to convert light to electrical signals. A test light source (60) and a reference target (76) are included within the housing (52) of the optical sensor (50). The test light source (60) is mounted proximate to the photosensitive devices (80) and the reference target (76) is positioned opposite from the test light source (60). The test light source (60) is periodically pulsed on to emit light (62) at a known wavelength. The light (62) is reflected from the reference target (60) back to at least a portion (82) of the photosensitive devices (80). A logic circuit uses the reflected light (64) which is received at the portion (82) of the photosensitive devices (80) to determine the distance between the light source (60) and the reference target (76). This calculated distance is compared against the known distance to verify correct operation of the optical sensor (50).

    摘要翻译： 公开了一种测试光学传感器（50）的操作的系统。 光学传感器（50）包括被配置为将光转换成电信号的一个或多个光敏器件（80）。 测试光源（60）和参考目标（76）被包括在光学传感器（50）的壳体（52）内。 测试光源（60）安装在光敏装置（80）附近并且参考目标（76）与测试光源（60）相对定位。 周期性地脉动测试光源（60）以发射已知波长的光（62）。 光（62）从参考目标（60）反射回光敏装置（80）的至少一部分（82）。 逻辑电路使用在光敏装置（80）的部分（82）处接收的反射光（64）来确定光源（60）与参考目标（76）之间的距离。 将该计算的距离与已知距离进行比较以验证光学传感器（50）的正确操作。

    System to detect failed pixels in a sensor array
    5.
    发明公开
    System to detect failed pixels in a sensor array 审中-公开
    系统zur Erkennung ausgefallener像素在einem传感器

    公开(公告)号：EP2632167A2

    公开(公告)日：2013-08-28

    申请号：EP13156168.0

    申请日：2013-02-21

    申请人： Rockwell Automation Technologies, Inc.

    发明人： Grinberg, Anatoly G. ,  Foster, Wayne R.

    IPC分类号： H04N17/00 ,  H04N5/367

    CPC分类号： H04N17/002 ,  H04N5/2256 ,  H04N5/367

    摘要： A system to test operation of an optical sensor (50) is disclosed. The optical sensor (50) includes one or more photosensitive devices (80) configured to convert light to electrical signals. A test light source (60) is included within the housing (52) of the optical sensor (50). The test light source (60) is periodically pulsed on to emit radiation (62) at a sufficient intensity to saturate each of the photosensitive devices (80). Each of the photosensitive devices (80) generates a signal corresponding to the intensity of light (62) detected at that device (80). A logic circuit uses the signals corresponding to the intensity of light to identify whether each of the photosensitive devices (80) is performing at an acceptable level.

    摘要翻译： 公开了一种用于测试光学传感器（50）的操作的系统。 光学传感器（50）包括被配置为将光转换成电信号的一个或多个感光装置（80）。 测试光源（60）包括在光学传感器（50）的壳体（52）内。 周期性地对测试光源（60）进行脉冲激发以以足够的强度发射辐射（62）以使每个光敏器件（80）饱和。 每个感光装置（80）产生对应于在该装置（80）处检测到的光强度（62）的信号。 逻辑电路使用对应于光强度的信号来识别每个感光装置（80）是否以可接受的水平执行。

    System to detect failed pixels in a sensor array
    6.
    发明公开
    System to detect failed pixels in a sensor array 审中-公开
    系统检测传感器阵列中的故障像素

    公开(公告)号：EP2632167A3

    公开(公告)日：2017-05-24

    申请号：EP13156168.0

    申请日：2013-02-21

    申请人： Rockwell Automation Technologies, Inc.

    发明人： Grinberg, Anatoly G. ,  Foster, Wayne R.

    IPC分类号： H04N17/00 ,  H04N5/225 ,  H04N5/367

    CPC分类号： H04N17/002 ,  H04N5/2256 ,  H04N5/367

    摘要： A system to test operation of an optical sensor (50) is disclosed. The optical sensor (50) includes one or more photosensitive devices (80) configured to convert light to electrical signals. A test light source (60) is included within the housing (52) of the optical sensor (50). The test light source (60) is periodically pulsed on to emit radiation (62) at a sufficient intensity to saturate each of the photosensitive devices (80). Each of the photosensitive devices (80) generates a signal corresponding to the intensity of light (62) detected at that device (80). A logic circuit uses the signals corresponding to the intensity of light to identify whether each of the photosensitive devices (80) is performing at an acceptable level.

    摘要翻译： 公开了一种测试光学传感器（50）的操作的系统。 光学传感器（50）包括被配置为将光转换成电信号的一个或多个光敏器件（80）。 测试光源（60）被包括在光学传感器（50）的壳体（52）内。 周期性地脉冲测试光源（60）以足够的强度发射辐射（62）以饱和每个光敏器件（80）。 每个光敏器件（80）产生对应于在该器件（80）处检测到的光的强度（62）的信号。 逻辑电路使用对应于光强度的信号来识别每个光敏器件（80）是否以可接受的水平执行。

    System and methods for improving a sensing ability of an interlock switch system
    7.
    发明公开
    System and methods for improving a sensing ability of an interlock switch system 有权
    系统与Verfahren zur Verbesserung derMessfähigkeiteines Verriegelungsschaltersystems

    公开(公告)号：EP2846340A1

    公开(公告)日：2015-03-11

    申请号：EP14183639.5

    申请日：2014-09-05

    申请人： Rockwell Automation Technologies, Inc.

    发明人： Burdenko, Michael N. ,  Foster, Wayne R.

    IPC分类号： H01H9/28 ,  H01H27/00 ,  G06K7/10

    CPC分类号： G07C9/00111 ,  G07C9/00896 ,  H01H9/285 ,  H01H27/00

    摘要： A system for improving a sensing ability of an interlock switch system may include an interlock switch and a target component. The interlock switch may include a first antenna coil that may receive one or more signals from one or more antenna coils within a sensing range of the first antenna coil. The target component may include an actuator that may interface with the interlock switch. The target component may also include at least two antenna coils. Each of the at least two antenna coils may then include an electronic identification (ID) associated with the target component.

    摘要翻译： 用于提高联锁开关系统的感测能力的系统可以包括互锁开关和目标部件。 互锁开关可以包括可以在第一天线线圈的感测范围内从一个或多个天线线圈接收一个或多个信号的第一天线线圈。 目标部件可以包括可以与互锁开关接合的致动器。 目标部件还可以包括至少两个天线线圈。 至少两个天线线圈中的每一个然后可以包括与目标部件相关联的电子标识（ID）。

    System to test performance of pixels in a sensor array
    8.
    发明公开
    System to test performance of pixels in a sensor array 审中-公开
    系统zurPrüfungder Leistung von Pixeln在einem传感器

    公开(公告)号：EP2632166A2

    公开(公告)日：2013-08-28

    申请号：EP13156161.5

    申请日：2013-02-21

    申请人： Rockwell Automation Technologies, Inc.

    发明人： Grinberg, Anatoly G. ,  Foster, Wayne R.

    IPC分类号： H04N17/00 ,  H04N5/367

    摘要： A system to test operation of an optical sensor (50) is disclosed. The optical sensor (50) includes one or more photosensitive devices (80) configured to convert light to electrical signals. A test light source (60) and a reference target (76) are included within the housing (52) of the optical sensor (50). The test light source (60) is mounted proximate to the photosensitive devices (80) and the reference target (76) is positioned opposite from the test light source (60). The test light source (60) is periodically pulsed on to emit light (62) at a known wavelength. The light (62) is reflected from the reference target (60) back to at least a portion (82) of the photosensitive devices (80). A logic circuit uses the reflected light (64) which is received at the portion (82) of the photosensitive devices (80) to determine the distance between the light source (60) and the reference target (76). This calculated distance is compared against the known distance to verify correct operation of the optical sensor (50).

    摘要翻译： 公开了一种用于测试光学传感器（50）的操作的系统。 光学传感器（50）包括被配置为将光转换成电信号的一个或多个感光装置（80）。 测试光源（60）和参考目标（76）包括在光学传感器（50）的壳体（52）内。 测试光源（60）安装在感光装置（80）附近，参考目标（76）与测试光源（60）相对定位。 周期性地对测试光源（60）进行脉冲激发以发射具有已知波长的光（62）。 光（62）从参考目标（60）反射回光敏装置（80）的至少一部分（82）。 逻辑电路使用在感光装置（80）的部分（82）处接收的反射光（64）来确定光源（60）和参考目标（76）之间的距离。 将该计算出的距离与已知距离进行比较，以验证光学传感器（50）的正确操作。

    Reteachable non-contact switching circuit
    9.
    发明公开
    Reteachable non-contact switching circuit 有权
    可拆卸的非接触式开关电路

    公开(公告)号：EP2320284A1

    公开(公告)日：2011-05-11

    申请号：EP10189735.3

    申请日：2010-11-02

    申请人： Rockwell Automation Technologies, Inc.

    发明人： Foster, Wayne R. ,  Vavra, Joshua D. ,  Tambeau, Steven R.

    IPC分类号： G05B19/042

    CPC分类号： G05B1/00 ,  G07C3/00 ,  G08B21/18

    摘要： A method for reteaching a switching circuit is provided. The method includes presenting a target within a sensing range of a sensor of the switching circuit for a pre-determined duration and acquiring an identification code of the target via the sensor. The method also includes comparing the acquired identification code with all stored identification codes of other targets previously used by the switching circuit as a basis for switching and reteaching the switching circuit for switching based on the acquired identification code if the acquired identification code is different from all stored identification codes previously used by the switching circuit as a basis for switching.

    摘要翻译： 提供了一种用于教授开关电路的方法。 该方法包括在开关电路的传感器的感测范围内呈现预定持续时间的目标并且经由传感器获取目标的识别码。 该方法还包括如果所获取的识别码不同于所有识别码，则将所获取的识别码与切换电路先前使用的其他目标的全部存储的识别码作比较，作为切换和再教育基于所获取的识别码进行切换的切换电路的基础 存储由切换电路先前使用的识别码作为切换的基础。