公开(公告)号：EP3581957A1

公开(公告)日：2019-12-18

申请号：EP19174636.1

申请日：2019-05-15

申请人： Rohde & Schwarz GmbH & Co. KG

发明人： AHMED, Sherif Sayed ,  GUMBMANN, Frank ,  KÖPPEL, Tobias ,  FREISSL, Michael ,  EVERS, Christian ,  FISCHER, Thomas

IPC分类号： G01S7/40 ,  G01S13/89 ,  G01S7/41 ,  G01R29/08 ,  H01Q1/42 ,  H01Q15/14 ,  G01S7/35

摘要： A measurement setup (10) for measuring attenuation through an irregular surface of a device under test (32) is described. The measurement setup (10) comprises a positioning system (14), a reference reflector (22) having a collection of diffuse scattering members (26), and a three dimensional imaging system (12). The measurement setup (10) has a reference state and a measurement state, wherein respective images are taken in the different states. The imaging system (12) is configured to compare the images taken in the reference state and the measurement state to determine the attenuation of the device under test (32). Further, a reference reflector (22) as well as a method for measuring attenuation are described.