摘要:
The invention relates to a method and a corresponding device for expanding the illumination of a test object (9), wherein a test object (9) is illuminated using an electromagnetic microwave signal (15) emitted from a transmission antenna (5). The microwave signal (16) which is reflected by said test object (9) is received by at least one reception antenna (6), and an image of said test object (9) is reconstructed by synthetically focussing this reflected microwave signal. According to the invention, at least one reflector element (21) is arranged oriented towards the test object (9), and the microwave signals (15', 16, 16') reflected by said reflector element (21), and by the test object (9), are received in a reception antenna (6) and used, along with the microwave beams from a transmission antenna (5) that are incident on the test object (9) without being reflected by the reflector element (21) and that are received by the reception antenna (6) without being reflected by said reflector element (21), in order to reconstruct the image of the test object (9).
摘要:
A measuring coupler for applying measuring signals to a measurement object contains a first coaxial connection (47), a waveguide connection (34), and a first strip conductor (41). Lower frequency range measuring signals are applied to the first coaxial connection (47). Higher frequency range measuring signals are applied to the waveguide connection (34). The measuring coupler routes the measuring signals to the measurement object via the first strip conductor (41).
摘要:
A measurement setup (10) for measuring attenuation through an irregular surface of a device under test (32) is described. The measurement setup (10) comprises a positioning system (14), a reference reflector (22) having a collection of diffuse scattering members (26), and a three dimensional imaging system (12). The measurement setup (10) has a reference state and a measurement state, wherein respective images are taken in the different states. The imaging system (12) is configured to compare the images taken in the reference state and the measurement state to determine the attenuation of the device under test (32). Further, a reference reflector (22) as well as a method for measuring attenuation are described.
摘要:
Person identification system (1) which has a scanning unit (2)which uses electromagnetic radiation to scan a person (3) who is to be identified. The electromagnetic radiation has a wavelength in the mm range and/or cm range. The scanning unit (2) produces a three-dimensional image of body geometries for the person (3) to be identified as measurement data in a memory unit (12). The person identification system (1) also has a processing unit (14) which conditions the measurement data and extracts the biometric features which are required for identification and compares them with biometric features which are stored in at least one further memory unit.
摘要:
The measuring device (11) is used to dectect a measuring signal from a circuit structure that has been applied to a wafer (1). Said device has at least one measuring tip (2) and at least one measuring transducer (4). The measuring transducer(s) (4) is or are electrically connected to the measuring tip(s) (2). The measuring transducer (4) is located on the measuring tip (2).
摘要:
A printed circuit board arrangement (1) electrically connects the at least one transmission and/or reception unit (3) to at least one antenna element (4), wherein the at least one transmission and/or reception unit (3) and the at least one antenna element (4) are integrated at least partially in the printed circuit board arrangement (1). The printed circuit board arrangement (1) comprises various printed circuit boards (21, 22, 25, 26), which are connected fixedly mechanically to one another. A first part (20) of the printed circuit board arrangement (1) is formed by at least one printed circuit board (21, 22), the substrate (21 3 ,22 3 ) of said printed circuit board consisting of a first material which is suitable for high frequencies, and a second part (24) of the printed circuit board arrangement (1) is formed by at least one printed circuit board (25, 26), the substrate of which consists of a second material, which is different than the first material and which is still sufficiently well suited for a low frequency and/or for a DC voltage range.