Process for forming an edge structure to seal integrated electronic devices, and corresponding device
    1.
    发明公开
    Process for forming an edge structure to seal integrated electronic devices, and corresponding device 失效
    一种用于边缘结构的集成电子器件的制备过程中被密封,并且相对应的设备

    公开(公告)号:EP0856886A1

    公开(公告)日:1998-08-05

    申请号:EP97830029.1

    申请日:1997-01-31

    IPC分类号: H01L23/00 H01L23/532

    摘要: A process for the formation of a device edge morphological structure (30) for protecting and sealing peripherally an electronic circuit integrated in a major surface (5) of a substrate of semiconductor material (6) is of the type that calls for formation above the major surface (5) of at least one dielectric multilayer (20) comprising a layer of amorphous planarizing material (22) having a continuous portion extending between two contiguous areas with a more internal first area (3') and a more external second area (4') in the morphological structure (30).
    In accordance with the present invention inside the device edge morphological structure (30) in the substrate (6) is formed an excavation on the side of the major surface (5) the more internal first area (3') of the morphological structure (30) in a zone in which is present the continuous portion of the dielectric multilayer (20).

    摘要翻译: 为集成在一个主表面的电子电路的保护和密封经外周为一个装置边缘的形态结构(30)的形成的方法,(5)的半导体材料的基片(6)是所述类型的那样呼叫为了形成上述的主要 至少一个电介质多层(20),包括无定形的平坦化材料的具有连续的部分中的两个相邻的区域之间延伸的具有多个内部第一区域(3“)的层(22)和多个外部的第二区域的表面(5)(4 “)(在形态结构30)。 在与在器件边缘的形态结构(30)内的本发明雅舞蹈的(6)在主表面的形态结构的侧面(5)的更内部的第一区域(3”)而形成的挖掘(30个基板 )(在所有的区域,其存在于电介质多层20)的连续部分。