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公开(公告)号：EP2284519A4
公开(公告)日：2014-04-23
申请号：EP08752781
申请日：2008-05-15
Applicant: SHIMADZU CORP
Inventor： ODA ICHIRO , YAJIMA ATSUSHI , HIZUME KENTARO , MEGA AKIMASA , KAMIKAKE TADAFUMI , KURATANI YUTAKA , FUJITA TAKESHI , TSUNAZAWA YOSHIO
CPC classification number: G01N21/6456 , G01N21/6486 , G01N21/763 , H04N5/2254 , H04N13/0217
Abstract: Optical waveguide paths to observe a sample on a sample holder from a plurality of directions while guiding an image of light in each direction which is emitted out of the sample toward a direction of a two dimensional detector via a main imaging lens include an optical waveguide path which never receives the light directly from the sample. The optical waveguide path which never receives the light directly from the sample forms an image of the sample within a substantial focus range of the main imaging lens, and includes optical elements arranged such that a light beam after formation of the image proceeds toward a direction of the main imaging lens. Optical elements on at least one optical waveguide path are those for forming real images. Therefore, the main imaging lens images the sample and those real images in block on the two dimentional detector.
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2.发明公开
公开(公告)号：EP2333524A4
公开(公告)日：2013-03-27
申请号：EP08810908
申请日：2008-09-18
Applicant: SHIMADZU CORP
Inventor： YAJIMA ATSUSHI , ODA ICHIRO , HIZUME KENTARO , TSUNAZAWA YOSHIO
CPC classification number: G01N21/6458 , A61B5/0059 , G01J3/4406 , G01J2003/1226 , G01N21/6428 , G01N2021/6471 , G01N2201/0612 , G01N2201/064 , G02B5/285 , G02B21/0032 , G02B21/0076
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3.发明公开METHOD AND APPARATUS FOR EVALUATING STRENGTH OF DIELECTROPHORESIS OF FINE PARTICLES 有权方法和设备进行评估强度细颗粒的介电电泳作者：
公开(公告)号：EP2042852A4
公开(公告)日：2012-01-04
申请号：EP06781228
申请日：2006-07-19
Applicant: SHIMADZU CORP
Inventor： TSUNAZAWA YOSHIO , WADA YUKIHISA , MORIYA NAOJI , TAKUBO KENJI , TOTOKI SHINICHIRO , SHIMAOKA HARUO
CPC classification number: G01N21/4788 , B03C5/005 , B03C5/026 , G01N2015/0003 , G01N2015/0038
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