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公开(公告)号：EP0986732A1
公开(公告)日：2000-03-22
申请号：EP98924294.6
申请日：1998-05-08
CPC分类号： B61L23/045 , G01B11/306 , G01N21/8901
摘要： The invention relates to a method for measuring unevenness created by grooves or long waves in the surface of an object, especially the travelling surface (111) of rails (111), from a measuring platform (13). The inventive measuring process occurs without contact, is largely unaffected by the relative movement of the measuring platform (13) and the object, and delivers good measuring results irrespective of the speed of the relative movement. According to the invention, a streak of light (19) is projected from the measuring platform (13) onto the surface, extending in the direction of movement. The angle of projection of said streak of light is fixed in relation to the surface normal. The streak of light (19) is represented by a plurality of successive instantaneous exposures on a photo-receiver (18) in such a way that the plurality of light streak images covers the surface along the rail in the direction of movement, at least without any gaps. Said photo-receiver (18) is arranged in a fixed position on the measuring platform (13), the exposure angle being tilted in relation to the angle of projection, and is sensitive to position to a large extent. The longitudinal profile of the surface in the direction of movement is then determined from the deformations in the plurality of light-streak images.
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