公开(公告)号：EP1691363A1

公开(公告)日：2006-08-16

申请号：EP06250009.5

申请日：2006-01-04

申请人： Samsung Electronics Co., Ltd.

发明人： Yoo, Jin-gyoo ,  Kim, Dae-eun ,  Chung, Koo-hyun 102-1308 Dongyang Express Apt.

IPC分类号： G11B9/00 ,  G11B9/12 ,  G11B9/14

CPC分类号： G11B9/1409 ,  G01Q80/00

摘要： Provided is a probe for a data storage apparatus. The probe includes a coating layer formed on a tip of the probe, wherein a peak of the tip is exposed and the coating layer and the peak form a predetermined contact area with respect to a recording medium. In addition, the probe may also include an insulating layer formed between the coating layer and the tip of the probe. The coating layer, the insulating layer, and the peak of the tip have a predetermined contact area with respect to the recording medium. Consequently, the probe can obtain high resolving ability by using a sharp-type tip and simultaneously can reduce the degree of abrasion of the peak of the tip, thereby resulting in an excellent durability.

摘要翻译： 提供了一种用于数据存储装置的探针。 探针包括形成在探针的尖端上的涂层，其中尖端的峰暴露，并且涂层和峰形成相对于记录介质的预定接触面积。 此外，探针还可以包括在涂层和探针的尖端之间形成的绝缘层。 涂层，绝缘层和尖端的峰值相对于记录介质具有预定的接触面积。 因此，探头可以通过使用尖锐的尖端获得高的分辨能力，同时可以降低尖端的峰值的磨损程度，从而获得优异的耐久性。