METHOD AND APPARATUS FOR DETECTING INFRARED RADIATION
    1.
    发明授权
    METHOD AND APPARATUS FOR DETECTING INFRARED RADIATION 失效
    用于检测红外辐射的方法和装置

    公开(公告)号:EP0345343B1

    公开(公告)日:1993-08-25

    申请号:EP89901495.5

    申请日:1988-10-28

    IPC分类号: H01L31/08 H01L27/14 G01J5/20

    摘要: A method and apparatus for detecting infrared radiation is disclosed. The apparatus comprises a substrate (12) having readout and signal processing circuits (14) integrated therein. The substrate (12) is formed from a material selected from the group consisting of silicon, gallium arsenide, or germanium. A first semiconductor layer (28) is grown on the substrate (12) from a material selected from the group consisting of mercury-cadmium-telluride, mercury-zinc-telluride, mercury-cadmium-selenide, mercury-zinc-selenide, mercury-cadmium-sulfide, mercury-zinc-sulfide, lead-tin-telluride, lead-tin-selenide, lead-tin-sulfide, indium-arsenide-antimonide, gallium-indium-antimonide, or gallium-antimonide-arsenide. A second semiconductor layer (30) is then grown on the first semiconductor layer (28).