Automatic test equipment with internal high speed interconnections
    1.
    发明授权
    Automatic test equipment with internal high speed interconnections 有权
    自动测试设备内部的高速连接

    公开(公告)号:EP1071962B1

    公开(公告)日:2003-12-17

    申请号:EP99918533.3

    申请日:1999-04-13

    申请人: TERADYNE, INC.

    发明人: CZAMARA, Allen

    IPC分类号: G01R31/319 G01R31/3167

    摘要: A tester is disclosed in which state coherency is maintained between functional blocks of the tester by way of a novel state distribution and recombination network. The network includes a plurality of nodes configured to provide point-to-point links can be adjusted by selecting a suitable node configuration and by programming delay circuitry included in each node. The network therefore maintains state coherence between the functional blocks by ensuring that delays throughout the test system are both deterministic and adjustable. The tester is particularly useful for testing complex, mixed-signal semiconductor devices.

    HIGH SPEED, REAL-TIME, STATE INTERCONNECT FOR AUTOMATIC TEST EQUIPMENT
    2.
    发明公开
    HIGH SPEED, REAL-TIME, STATE INTERCONNECT FOR AUTOMATIC TEST EQUIPMENT 有权
    随着高速实时状态有关自动测试设备

    公开(公告)号:EP1071962A1

    公开(公告)日:2001-01-31

    申请号:EP99918533.3

    申请日:1999-04-13

    申请人: TERADYNE, INC.

    发明人: CZAMARA, Allen

    IPC分类号: G01R31/319 G01R31/3167

    摘要: A tester is disclosed in which state coherency is maintained between functional blocks of the tester by way of a novel state distribution and recombination network. The network includes a plurality of nodes configured to provide point-to-point links can be adjusted by selecting a suitable node configuration and by programming delay circuitry included in each node. The network therefore maintains state coherence between the functional blocks by ensuring that delays throughout the test system are both deterministic and adjustable. The tester is particularly useful for testing complex, mixed-signal semiconductor devices.