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    Method and device for measuring inter-chip signals
    2.
    发明公开
    Method and device for measuring inter-chip signals 有权
    Verfahren und Vorrichtung zum Messen von Inter-Chip-Signalen

    公开(公告)号：EP2341356A1

    公开(公告)日：2011-07-06

    申请号：EP10252136.6

    申请日：2010-12-16

    申请人： Tektronix, Inc.

    发明人： Mooyman-Beck, Bart A. ,  Woolhiser, Robert J. ,  Cosgrove, Kevin E. ,  Knierim, Daniel G.

    IPC分类号： G01R31/3185 ,  G01R31/319 ,  H01L25/065

    CPC分类号： G01R31/318511 ,  G01R31/318513 ,  H01L2224/16225 ,  H01L2225/06596 ,  H01L2924/15192 ,  H01L2924/15311 ,  H01L2924/157

    摘要： A method and device for measuring a signal of a die to be placed within a package is disclosed. At least one die as a Device Under Test (DUT) is mounted on a substrate and a chip-type measurement instrument is mounted on the substrate, or embedded into the substrate, wherein the instrument analyzes and/or processes the signal of the DUT and may provide stimulus signal to the DUT. The substrate having the DUT and the measurement instrument is mounted on a circuit board that has plural electrodes to be connected to the signal paths of the DUT and the instrument. An electrode is coupled to a standard interface port to provide the signal of the chip-type instrument to an external instrument.

    摘要翻译： 公开了一种用于测量待放置在封装内的管芯的信号的方法和装置。 至少一个裸片作为被测设备（DUT）安装在基板上，芯片式测量仪器安装在基板上或嵌入到基板中，其中仪器分析和/或处理DUT的信号， 可以向DUT提供刺激信号。 具有DUT的基板和测量仪器安装在具有要连接到DUT和仪器的信号路径的多个电极的电路板上。 电极耦合到标准接口端口，以将芯片型仪器的信号提供给外部仪器。

    Test and measurement instrument and method of calibrating
    4.
    发明公开
    Test and measurement instrument and method of calibrating 审中-公开
    Prüf-und Messinstrument und Kalibrierverfahren

    公开(公告)号：EP2060925A2

    公开(公告)日：2009-05-20

    申请号：EP08253609.5

    申请日：2008-11-05

    申请人： TEKTRONIX, INC.

    发明人： Acuff, Ronald A. ,  Larson, Lester L. ,  Cosgrove, Kevin E.

    IPC分类号： G01R31/319 ,  G01R31/3177 ,  G06F11/25

    CPC分类号： G01R31/3177 ,  G01R31/3191 ,  G06F11/25

    摘要： A test and measurement instrument and a method of calibrating the test and measurement instrument including a reference signal generator (12); multiple input channels (14); and multiple input circuits (16). Each input channel is coupled to a corresponding input circuit; and one of the input circuits is coupled to the reference signal generator.

    摘要翻译： 一种测试和测量仪器以及校准包括参考信号发生器（12）的测试和测量仪器的方法; 多个输入通道（14）; 和多个输入电路（16）。 每个输入通道耦合到相应的输入电路; 并且其中一个输入电路耦合到参考信号发生器。