公开(公告)号：EP4201328A1

公开(公告)日：2023-06-28

申请号：EP21216422.2

申请日：2021-12-21

申请人： Universität Hamburg ,  Technische Universität Berlin

发明人： Baumann, Jonas ,  Schlesiger, Christopher Philip ,  Grüner, Florian ,  Staufer, Theresa ,  Schmutzler, Oliver ,  Körnig, Christian

IPC分类号： A61B6/00 ,  A61B6/06 ,  G01N23/223 ,  G21K1/02 ,  G21K1/06

摘要： An X-ray irradiation apparatus (100) comprises an X-ray source device (110) for creating X-rays (2) with a polychromatic spectrum and an X-ray optic device (120) with a beam axis (3) that is longitudinal, wherein the X-ray optic device (120) comprises a reflector device (121) that is polycrystalline having a reflector geometry, a reflector mosaicity and a reflector thickness and the reflector device (121) is arranged for receiving a portion of the X-rays (2) within an acceptance angle of the reflector device (121) and for creating an X-ray beam (4) by Bragg reflection, which is directed along the beam axis (3) towards a focal position thereof and has a spectral distribution determined by the polychromatic spectrum of the X-rays (2), the reflector geometry, the reflector mosaicity and the reflector thickness, and wherein the X-ray optic device (120) further comprises a spectral filter aperture device (122) that is arranged downstream from the reflector device (121) for creating a filter gap (123) transmitting a first spectral portion (4A) of the spectral distribution of the X-ray beam (4) and blocking a second spectral portion (4B) and a third spectral portion (4C) of this spectral distribution, wherein the first spectral portion (4A) has higher energies than the second spectral portion (4B) and lower energies than the third spectral portion (4C), wherein the reflector device (121) has an acceptance solid-angle of at least 100 micro-steradian, and wherein the reflector geometry, the reflector mosaicity, the reflector thickness and the acceptance angle of the reflector device (121) are selected such that simultaneously a radiation flux in the first spectral portion (4A) is at least 1% of an incoming flux of the same spectral portion of the X-rays (2) received by the reflector device (121) with a peak reflectivity of at least 1%, the first spectral portion (4A) has a spectral bandwidth of at most 15 %, the second and third spectral portions (4B, 4C) have a flux reduced by at least three orders of magnitude compared with the flux in the first spectral portion (4A), and the X-ray beam (4) has a focal spot size of less than 1.5 mm. Furthermore, an X-ray fluorescence imaging apparatus (200) and a method of using the X-ray irradiation apparatus (100) are described.

公开(公告)号：EP4390463A1

公开(公告)日：2024-06-26

申请号：EP22216393.3

申请日：2022-12-23

申请人： Universität Hamburg

发明人： Grüner, Florian ,  Staufer, Theresa

IPC分类号： G01T1/24

CPC分类号： G01T1/247

摘要： An X-ray detector apparatus 100 for detecting incoming X-ray photons of X-ray radiation to be sensed, comprises an X-ray detector device 10 having an X-ray detector section 11 and an entrance section 12, wherein the X-ray detector section 11 is arranged for detecting the X-ray photons incoming through the entrance section 12 by creating photo electrons in response to an interaction of the incoming X-ray photons with the X-ray detector section 11 and for providing an X-ray output signal, which is determined by the detected X-ray photons, and a background suppression device 20 being configured for suppressing background contributions in the X-ray output signal which are caused by at least one of escape electrons being emitted from the X-ray detector device 10 in response to an absorption of the X-ray radiation and external electrons occurring outside the X-ray detector device 10. Furthermore, an X-ray detection method is described.