公开(公告)号：EP2299468A1

公开(公告)日：2011-03-23

申请号：EP09170780.2

申请日：2009-09-20

Applicant: Universiteit Antwerpen

Inventor： Van Dyck, Dirk

IPC: H01J37/26

CPC classification number: H01J37/26 ,  H01J37/222 ,  H01J2237/2614 ,  H01J2237/2802

Abstract: A method (100) and system are described for obtaining wave function data from microscope measurements. The method comprises receiving (110) microscope image intensity data acquired using a phase inducing means whereby the data are acquired over predetermined image recording times and whereby a phase shift induced by the phase inducing means is kept constant. The method furthermore comprises extracting (130) wave function data from the microscope image intensity data acquired over predetermined image recording times, whereby the predetermined image recording times are function of a phase shift angle θ . A corresponding transmission microscope and corresponding computer related products also are disclosed.

Abstract translation: 描述了用于从显微镜测量获得波函数数据的方法（100）和系统。 该方法包括接收使用相位诱导装置获取的（110）显微镜图像强度数据，由此在预定的图像记录时间获取数据，由此由相位诱导装置引起的相移保持恒定。 该方法还包括从预定图像记录时间获取的显微镜图像强度数据中提取（130）波函数数据，由此预定图像记录时间是相移角¸的函数。 相应的透射显微镜和相应的计算机相关产品也被公开。

公开(公告)号：EP2309459A1

公开(公告)日：2011-04-13

申请号：EP09170779.4

申请日：2009-09-20

Applicant: Universiteit Antwerpen

Inventor： Van Dyck, Dirk

IPC: G06T11/00 ,  H01J37/22

CPC classification number: G06T11/006 ,  H01J37/222 ,  H01J37/26 ,  H01J2237/226 ,  H01J2237/2611

Abstract: A method and system are described for reconstructing a coherent radiation tomographic image of at least one object. The method comprises performing back-projection, whereby performing back-projection comprises taking into account propagation waves from the point of interaction to a plane of detection. Furthermore a method is described for studying objects, wherein a plurality of objects are imaged on a substrate using coherent radiation tomography and whereby the method as described above is used for characterizing the objects.

Abstract translation: 描述了用于重构至少一个对象的相干辐射断层图像的方法和系统。 该方法包括执行反投影，由此执行反投影包括考虑从相互作用点到检测平面的传播波。 此外，描述了用于研究物体的方法，其中使用相干辐射断层摄影将多个物体成像在基板上，并且由此使用上述方法来表征物体。