TIME-TO-DIGITAL CONVERSION WITH DELAY CONTRIBUTION DETERMINATION OF DELAY ELEMENTS
    2.
    发明授权
    TIME-TO-DIGITAL CONVERSION WITH DELAY CONTRIBUTION DETERMINATION OF DELAY ELEMENTS 有权
    时间在数字化实现方延迟元件时延的影响测定

    公开(公告)号:EP1985019B1

    公开(公告)日:2009-08-05

    申请号:EP06708729.6

    申请日:2006-03-10

    发明人: RIVOIR, Jochen

    CPC分类号: G04F10/005

    摘要: A time-to-digital converter (110) comprising at least one chain of delay elements (126.1,..., 126.N), wherein a status of said chain of delay elements (126.1,..., 126.N) represents a digital signal relating to a time interval to be converted, wherein said time- to-digital converter (110) comprises means (156) for providing trigger signals (154) having statistically equally distributed variable positions relative to a pulse forwarded in said chain of delay elements (126.1,..., 126.N), means (130) for capturing said status of said chain of delay elements (126.1,..., 126.N) in response to said calibration trigger signals (154), wherein said status depends on delay times of said delay elements (126.1,..., 126.N), means for determining an actual contribution of at least some of said delay elements (126.1,..., 126.N) to an overall delay of said chain of delay elements (126.1,..., 126.N) on the basis of occurrences of pulse positions in response to said calibration trigger signals (154), and means (164) for taking into account said actual contribution of at least some of said delay elements (126.1,..., 126.N) when converting said time interval into said digital signal (168).

    FORMAT TRANSFORMATION OF TEST DATA
    3.
    发明授权
    FORMAT TRANSFORMATION OF TEST DATA 有权
    试验数据的格式转换

    公开(公告)号:EP1994535B1

    公开(公告)日:2009-07-01

    申请号:EP06708737.9

    申请日:2006-03-13

    发明人: RIVOIR, Jochen

    IPC分类号: G11C29/44

    摘要: A device (203) for processing test data, the device (203) comprising a data input interface (204) adapted for receiving primary test data indicative of a test carried out for testing a device under test (202), the primary test data being provided in a primary format, a processing unit (205) adapted for generating secondary test data in a secondary format by transforming, by carrying out a coordinate transformation, the primary test data from the primary format into the secondary format, and a data output interface (206) adapted for providing the secondary test data in the secondary format for storing the secondary test data in a plurality of storage units (207a to 207c).

    TIME-TO-DIGITAL CONVERSION WITH DELAY CONTRIBUTION DETERMINATION OF DELAY ELEMENTS
    4.
    发明公开
    TIME-TO-DIGITAL CONVERSION WITH DELAY CONTRIBUTION DETERMINATION OF DELAY ELEMENTS 有权
    时间在数字化实现方延迟元件时延的影响测定

    公开(公告)号:EP1985019A1

    公开(公告)日:2008-10-29

    申请号:EP06708729.6

    申请日:2006-03-10

    发明人: RIVOIR, Jochen

    IPC分类号: H03M1/10 H03M1/14 H03M1/50

    CPC分类号: G04F10/005

    摘要: A time-to-digital converter (110) comprising at least one chain of delay elements (126.1,..., 126.N), wherein a status of said chain of delay elements (126.1,..., 126.N) represents a digital signal relating to a time interval to be converted, wherein said time- to-digital converter (110) comprises means (156) for providing trigger signals (154) having statistically equally distributed variable positions relative to a pulse forwarded in said chain of delay elements (126.1,..., 126.N), means (130) for capturing said status of said chain of delay elements (126.1,..., 126.N) in response to said calibration trigger signals (154), wherein said status depends on delay times of said delay elements (126.1,..., 126.N), means for determining an actual contribution of at least some of said delay elements (126.1,..., 126.N) to an overall delay of said chain of delay elements (126.1,..., 126.N) on the basis of occurrences of pulse positions in response to said calibration trigger signals (154), and means (164) for taking into account said actual contribution of at least some of said delay elements (126.1,..., 126.N) when converting said time interval into said digital signal (168).

    CONVERTING NON-EQUIDISTANT SIGNALS INTO EQUIDISTANT SIGNALS
    5.
    发明公开
    CONVERTING NON-EQUIDISTANT SIGNALS INTO EQUIDISTANT SIGNALS 审中-公开
    将不平等信号转换为等效信号

    公开(公告)号:EP2055005A1

    公开(公告)日:2009-05-06

    申请号:EP06778339.9

    申请日:2006-08-24

    发明人: RIVOIR, Jochen

    IPC分类号: H03M1/12 G01R13/02 G01R31/28

    CPC分类号: G01R19/2509 H03M1/1285

    摘要: A signal processing device (100), preferably an undersampling ADC using coherent sampling, is presented for processing a signal (102) , the signal processing device (100) comprising a comparator unit (105) for comparing the signal (102) with a reference signal (106), a generation unit (105, 130) for generating digital result signals (110) indicative of the result of the comparing, an evaluation unit (112) for determining transition times of the digital result signals (110), and an output signal calculation unit (115) adapted for calculating essentially uniformly spaced output signals (116).

    摘要翻译: 提供了一种信号处理设备(100),优选为使用相干采样的欠采样ADC,用于处理信号(102),信号处理设备(100)包括用于将信号(102)与参考 信号(106),产生指示比较结果的数字结果信号(110)的产生单元(105,130),用于确定数字结果信号(110)的转换时间的评估单元(112) 输出信号计算单元(115),适于计算基本均匀间隔的输出信号(116)。

    ASYNCHRONOUS SIGMA-DELTA DIGITAL-ANALOG CONVERTER
    6.
    发明公开
    ASYNCHRONOUS SIGMA-DELTA DIGITAL-ANALOG CONVERTER 审中-公开
    ASYNCHRONE SIGMA-DELTA-DIGITAL-ANALOG-UMSETZER

    公开(公告)号:EP2047602A1

    公开(公告)日:2009-04-15

    申请号:EP06778095.7

    申请日:2006-08-01

    发明人: RIVOIR, Jochen

    IPC分类号: H03M3/02 H03M1/66 H03M1/84

    CPC分类号: H03M7/3024

    摘要: An asynchronous sigma delta digital to analog converter (100) for converting a digital input signal (u[k]) into an analog output signal (f(t)), the digital to analog converter (100) comprising an asynchronous sigma delta modulator (120) comprising a low pass filter (104) and a comparator (106) and being supplied with the digital input signal (u[k]), and a clock sample unit (108) adapted to sample a signal (x(t)) processed by the comparator (106) based on a clock signal (fb), thereby generating the analog output signal (f(t)).

    UNDERSAMPLING OF A REPETITIVE SIGNAL FOR MEASURING TRANSISTION TIMES TO RECONSTRUCT AN ANALOG WAVEFORM
    7.
    发明公开
    UNDERSAMPLING OF A REPETITIVE SIGNAL FOR MEASURING TRANSISTION TIMES TO RECONSTRUCT AN ANALOG WAVEFORM 有权
    UNDER SCAN区循环信号,用于测量的过渡期重建模拟形式的

    公开(公告)号:EP2044692A1

    公开(公告)日:2009-04-08

    申请号:EP06764253.8

    申请日:2006-07-21

    IPC分类号: H03M1/12

    摘要: A signal processing device (100) for processing a repetitive signal (102), the signal processing device (100) comprising a determining unit (103) for determining a number of points of time for undersampling the repetitive signal (102), a comparator unit (105) for comparing, at the number of points of time, the repetitive signal (102) with a reference signal (106), a generation unit (105) for generating digital result signals (110) indicative of the result of the comparing, and an evaluation unit (112) for determining transition times of the digital result signals (110).

    摘要翻译: 一种信号处理装置(100),用于处理包括确定性挖掘单元(103),用于确定的采矿多个时间点为欠重复信号(102),比较器单元的重复信号(102),信号处理装置(100) (105)用于比较,在时间点的数量,所述重复信号(102)与用于产生数字结果信号(110)指示所述比较结果的一个参考信号(106),生成单元(105), 和评估单元(112),用于将数字结果信号(110)的确定性采矿过渡时间。

    FORMAT TRANSFORMATION OF TEST DATA
    9.
    发明公开
    FORMAT TRANSFORMATION OF TEST DATA 有权
    试验数据的格式转换

    公开(公告)号:EP1994535A1

    公开(公告)日:2008-11-26

    申请号:EP06708737.9

    申请日:2006-03-13

    发明人: RIVOIR, Jochen

    IPC分类号: G11C29/44

    摘要: A device (203) for processing test data, the device (203) comprising a data input interface (204) adapted for receiving primary test data indicative of a test carried out for testing a device under test (202), the primary test data being provided in a primary format, a processing unit (205) adapted for generating secondary test data in a secondary format by transforming, by carrying out a coordinate transformation, the primary test data from the primary format into the secondary format, and a data output interface (206) adapted for providing the secondary test data in the secondary format for storing the secondary test data in a plurality of storage units (207a to 207c).