摘要:
A time-to-digital converter (110) comprising at least one chain of delay elements (126.1,..., 126.N), wherein a status of said chain of delay elements (126.1,..., 126.N) represents a digital signal relating to a time interval to be converted, wherein said time- to-digital converter (110) comprises means (156) for providing trigger signals (154) having statistically equally distributed variable positions relative to a pulse forwarded in said chain of delay elements (126.1,..., 126.N), means (130) for capturing said status of said chain of delay elements (126.1,..., 126.N) in response to said calibration trigger signals (154), wherein said status depends on delay times of said delay elements (126.1,..., 126.N), means for determining an actual contribution of at least some of said delay elements (126.1,..., 126.N) to an overall delay of said chain of delay elements (126.1,..., 126.N) on the basis of occurrences of pulse positions in response to said calibration trigger signals (154), and means (164) for taking into account said actual contribution of at least some of said delay elements (126.1,..., 126.N) when converting said time interval into said digital signal (168).
摘要:
A device (203) for processing test data, the device (203) comprising a data input interface (204) adapted for receiving primary test data indicative of a test carried out for testing a device under test (202), the primary test data being provided in a primary format, a processing unit (205) adapted for generating secondary test data in a secondary format by transforming, by carrying out a coordinate transformation, the primary test data from the primary format into the secondary format, and a data output interface (206) adapted for providing the secondary test data in the secondary format for storing the secondary test data in a plurality of storage units (207a to 207c).
摘要:
The invention relates to a communication circuit (M11) for providing a bi-directional data transmission over a signal line, thereby receiving a first digital data stream (DD1) and transmitting a corresponding first signal (S1) into a near end of a signal line (TL) to be transmitted to a remote device, the remote device being connected to a far end of the signal line (TL), receiving a second signal (S2) at the near end of the signal line (TL) from the remote device and deriving a second digital data stream (RC1) from this signal, comprising a replica generator (RG) for providing, in response to the first digital data stream (DD1) or a signal derived therefrom, a replica signal (S1b), and an extraction circuit (EC) for extracting the second digital data stream (RC1) from the second signal (S2) in response to the replica signal (S1b) and a comparator signal (S2b) deduced from the near end of the signal line (TL). The invention further relates to an automatic test equipment comprising a plurality of communication circuits each providing a bi-directional data transmission.
摘要:
A time-to-digital converter (210) comprising at least one chain of delay elements (226.1, 226.2,...), wherein a status of said chain of delay elements (226.1, 226.2,...) represents a digital signal relating to a time interval (t1) to be converted, wherein said time-to-digital converter (210) comprising means (270) for injecting a calibration pulse (t3-t2) of known position and/or known duration in time into said chain of delay elements (226.1, 226.2,...), wherein a first status of said chain of delay elements (226.1, 226.2,...) being expected in response to said calibration pulse (t3-t2), said time-to-digital converter (210) further comprising means for capturing (288, 290) said actual status of said chain of delay elements (226.1, 226.2,...) in response to said calibration pulse (t3-t2), means (281) for calculating a deviation between said expected first status and said actual status, and means (266) for taking into account said deviation when converting said time (t1) interval to said digital signal.