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73 条记录 (耗时 0.015 秒)

    DISPLAY DEFECT DETECTION METHOD, DEVICE AND EQUIPMENT
    1.
    发明公开
    DISPLAY DEFECT DETECTION METHOD, DEVICE AND EQUIPMENT 审中-公开

    公开(公告)号：EP3361239A1

    公开(公告)日：2018-08-15

    申请号：EP16858943.0

    申请日：2016-10-19

    申请人： Huawei Technologies Co., Ltd.

    发明人： ZHANG, Huiqiang

    IPC分类号： G01N21/88 ,  G01N21/95 ,  G01M11/02 ,  G02F1/13

    CPC分类号： G01N21/95 ,  G01N21/88 ,  G01N2021/9513 ,  G02F1/1309 ,  G02F2203/69 ,  G06T7/0008 ,  G06T7/001 ,  G06T2207/30121

    摘要： The present invention discloses a display defect detection method, apparatus, and device for a display screen. The method includes: identifying a suspected defective pixel from a first image of a front side of a tested display screen, where the first image is shot when the tested display screen is in a solid-color display state; identifying an external smudgy pixel from a second image of the front side of the tested display screen, where the second image is shot when the tested display screen is in a die-out state and the front side is illuminated by a diffuse reflection light source; detecting, for each suspected defective pixel identified from the first image, whether a pixel at a same location in the second image is the external smudgy pixel; and if no, determining the suspected defective pixel as a display defective pixel.

    METHOD AND APPARATUS FOR MURA DETECTION AND METROLOGY
    6.
    发明公开
    METHOD AND APPARATUS FOR MURA DETECTION AND METROLOGY 审中-公开
    VERFAHREN UND VORRICHTUNG ZUR MURAERKENNUNG UND MESSTECHNIK

    公开(公告)号：EP2147296A1

    公开(公告)日：2010-01-27

    申请号：EP08751008.7

    申请日：2008-04-18

    申请人： MICRONIC LASER SYSTEMS AB

    发明人： SANDSTROM, Torbjörn ,  STIBLERT, Lars

    IPC分类号： G01N21/956 ,  G02F1/13 ,  G06F1/00

    CPC分类号： G01N21/956 ,  G01N2021/9513 ,  G02F1/1309 ,  G03F1/84 ,  G06T7/0006 ,  G06T7/001 ,  G06T2207/30121 ,  G06T2207/30148 ,  G06T2207/30164

    摘要： The invention addresses the lack of comprehensive and quantitative methods for measurements of unwanted visual “mura” effects in displays and image sensors. Mura is generated by errors that are significantly smaller than what is needed for the function of the device, and sometimes smaller than the random variations in the patterns or structures. Capturing essentially all mura defects in a workpiece in a short time requires a daunting combination of sensitivity, statistical data reduction and speed. The invention devices an inspection method, e.g. optical, which maximizes the sensitivity to mura effects and suppresses artifacts from the mura inspection hardware itself and from noise. It does so by scanning the sensor, e.g. a high-resolution camera, creating a region of high internal accuracy across the mura effects. One important example is for mura related to placement errors, where a stage with better than 10 nanometer precision within a 100 mm range is created. A sampling scheme reduces the data volume and separates between instrument errors and real defects based on their different geometrical signatures. The high-resolution camera scans sparse lines at an angle to the dominating directions of expected mura defects, creating extended sensor fields with high internal precision, and quantifying edge placements in small windows in said extended fields. The mura is classified and presented as type, location and severity.

    摘要翻译： 本发明解决了缺乏用于在显示器和图像传感器中测量不期望的视觉“mura”效应的综合和定量方法。 Mura由显着小于设备功能所需的错误产生，有时小于模式或结构中的随机变化。 在短时间内捕获工件中基本上所有的mura缺陷都需要灵敏度，统计数据减少和速度的令人惊奇的组合。 本发明装置一种检查方法，例如 光学，其最大化对mura效应的敏感性，并抑制来自mura检查硬件本身的噪声和噪声。 它通过扫描传感器，例如 一个高分辨率的摄像头，创造出一个高度内部准确度的区域在mura效果。 一个重要的例子就是与定位错误相关的mura，其中创建了100mm范围内具有10纳米以上精度的阶段。 采样方案可以减少数据量，并根据不同的几何特征分离仪器误差和实际缺陷。 高分辨率摄像机以与预期的mura缺陷的主导方向成一定角度扫描稀疏线，创建具有高内部精度的扩展传感器场，以及在所述扩展场中的小窗口中量化边缘放置。 mura被分类并呈现为类型，位置和严重性。

    Testing apparatus for fixing and testing a LCD panel
    7.
    发明公开
    Testing apparatus for fixing and testing a LCD panel 审中-公开
    Testvorrichtung zur Befestigung und zum Test einerFlüssigkristallanzeigetafel

    公开(公告)号：EP2116890A1

    公开(公告)日：2009-11-11

    申请号：EP08156017.9

    申请日：2008-05-09

    申请人： Kuo, Shun-Kun

    发明人： Kuo, Shun-Kun

    IPC分类号： G02F1/13

    CPC分类号： G02F1/1309 ,  G01N21/95 ,  G01N2021/9513 ,  G02F2203/69 ,  G03B15/00 ,  G03B17/561

    摘要： A testing apparatus for fixing and testing a LCD panel is provided. It mainly comprises a location frame (3) and an adjustable base (6) for fixing a camera set (7). The location frame and the adjustable base are connected together via a holder set (1). The adjustable base is able to be adjusted a distance between the location frame on the holder set. The location frame comprises a framework (33) with adjustable plates (4) on the edges of the backside of the framework. The adjustable plates are adjusted according to different sizes of the LCD panels (8) for placing LCD panels with different sizes. The LCD panel is supported by top-supporting devices (5) on the backside of the framework and located at the backside of the framework. Each edge of the framework is set with a movable shade (34) which is adjusted according to different sizes of the LCD panels for shading metal rims of the LCD panel. When the camera set takes pictures of the LCD panel, the boundaries of the screen area and the rims are clearly defined to make the testing module accurately test the defects of the LCD panel and to improve testing quality.

    摘要翻译： 提供一种用于固定和测试LCD面板的测试装置。 它主要包括用于固定相机组（7）的定位框架（3）和可调节底座（6）。 位置框架和可调节底座通过支架组（1）连接在一起。 可调底座能够调节支架上的位置框架之间的距离。 位置框架包括在框架的背面的边缘上具有可调节板（4）的框架（33）。 根据不同尺寸的LCD面板（8）调节可调节板，以便放置不同尺寸的LCD面板。 LCD面板由框架背面的顶部支撑装置（5）支撑，位于框架的背面。 框架的每个边缘设置有可移动的遮光罩（34），其根据LCD面板的不同尺寸进行调整，用于遮蔽LCD面板的金属边缘。 当相机组拍摄LCD面板时，屏幕区域和边框的边界被明确定义，以使测试模块准确测试LCD面板的缺陷并提高测试质量。

    METHOD AND APPARATUS FOR INSPECTING FRONT SURFACE SHAPE
    8.
    发明公开
    METHOD AND APPARATUS FOR INSPECTING FRONT SURFACE SHAPE 有权
    VERFAHREN UND VORRICHTUNG ZUM UNTERSUCHEN EINERVORDERFLÄCHENFORM

    公开(公告)号：EP1750087A1

    公开(公告)日：2007-02-07

    申请号：EP05745755.8

    申请日：2005-06-02

    申请人： Asahi Glass Company, Limited

    发明人： SONDA, Yoshiyuki c/o Asahi Glass Company, Ltd ,  OTO, Kimiaki c/o Asahi Glass Company, Ltd ,  KATO, Munehisa c/o Asahi Glass Company, Ltd ,  KIYAMA, Atsushi. Asahi Glass Fine Techno Co.,Ltd.

    IPC分类号： G01B11/25

    CPC分类号： G01N21/896 ,  G01N2021/9513

    摘要： The present invention provides an inspection method and an inspection apparatus which can remove influence of rear surface reflection image and inspect characteristic of a front surface shape with good accuracy by an inexpensive apparatus construction. First of all, as a stripe pattern suitable for a transparent plate-shaped object 3 (object to be inspected), a stripe pattern 1 having a bright-dark pattern configured so that its reflection image produced by the front surface of the transparent plate-shaped object and its reflection image produced by a rear surface of the transparent plate-shaped object are separated in an image signal obtained by image-capturing, is determined. Thereafter, using the decided stripe pattern 1, the front surface shape of the transparent plate-shaped object 3 is evaluated by an image analysis using only a reflection image of the stripe pattern 1 produced by the transparent plate-shaped object 3.

    摘要翻译： 本发明提供一种检查方法和检查装置，其可以通过廉价的装置结构以高精度检测背面反射图像的影响并检查前表面形状的特性。 首先，作为适合于透明板状物体3（待检查物体）的条纹图案，具有深色图案的条纹图案1，其配置为使得由透明板状物体3的前表面产生的反射图像， 确定由图像捕获获得的图像信号中的透明板状物体的后表面产生的成像物体及其反射图像。 此后，使用决定的条纹图案1，通过仅使用由透明板状物体3产生的条纹图案1的反射图像的图像分析来评价透明板状物体3的前表面形状。

    Liquid crystal panel inspection method
    9.
    发明公开
    Liquid crystal panel inspection method 失效
    液晶面板检测方法

    公开(公告)号：EP0495481A3

    公开(公告)日：1993-06-02

    申请号：EP92100604.5

    申请日：1992-01-15

    申请人： YOZAN INC. ,  SHARP KABUSHIKI KAISHA

    发明人： Kumagai, Ryohei ,  Hiiro, Kaoru ,  Shimizu, Harumi ,  Oosaka, Manabu ,  Takahashi, Tooru

    IPC分类号： G01N21/88 ,  G06F15/00

    CPC分类号： G01N21/88 ,  G01N2021/9513

    摘要： It is possible to inspect a liquid crystal panel and find a kind of defect without skill in a short time by the present disclosure. A part is inspected by using an extracted reference part which is extracted by i) calculating a vector data starting from a characteristic point on a contour of a part which is judged to be defectless, ii) determining the contour of a reference part according to the vector data obtained in i), and iii) extracting a reference part on the contour in ii). The kind of a part is judged by classifying the distribution of the two-dimensional static value of a defective part according to the distribution map of the two-dimensional static value of the histogram of a defective part obtained by experience.

    Liquid crystal panel inspection method
    10.
    发明公开
    Liquid crystal panel inspection method 失效
    液晶面板检查方法

    公开(公告)号：EP0495481A2

    公开(公告)日：1992-07-22

    申请号：EP92100604.5

    申请日：1992-01-15

    申请人： YOZAN INC. ,  SHARP KABUSHIKI KAISHA

    发明人： Kumagai, Ryohei ,  Hiiro, Kaoru ,  Shimizu, Harumi ,  Oosaka, Manabu ,  Takahashi, Tooru

    IPC分类号： G01N21/88 ,  G06F15/00

    CPC分类号： G01N21/88 ,  G01N2021/9513

    摘要： It is possible to inspect a liquid crystal panel and find a kind of defect without skill in a short time by the present disclosure.
    A part is inspected by using an extracted reference part which is extracted by i) calculating a vector data starting from a characteristic point on a contour of a part which is judged to be defectless, ii) determining the contour of a reference part according to the vector data obtained in i), and iii) extracting a reference part on the contour in ii).
    The kind of a part is judged by classifying the distribution of the two-dimensional static value of a defective part according to the distribution map of the two-dimensional static value of the histogram of a defective part obtained by experience.

    摘要翻译： 通过本公开可以在短时间内检查液晶面板并找到一种缺乏技能的缺陷。 通过使用提取的参考部分来检查部分，所述提取的参考部分通过i）从被判断为无缺陷的部分的轮廓上的特征点开始计算矢量数据，ii）根据所述参考部分的轮廓来确定参考部分的轮廓 在i）中获得的矢量数据，以及iii）在ii）中提取轮廓上的参考部分。 通过根据经验获得的缺陷部分的直方图的二维静态值的分布图分类缺陷部分的二维静态值的分布来判断部分的种类。