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    X-RAY LINE SCAN FOR FOREIGN OBJECT DEBRIS DETECTION
    1.
    发明公开
    X-RAY LINE SCAN FOR FOREIGN OBJECT DEBRIS DETECTION 审中-公开

    公开(公告)号：EP4431926A1

    公开(公告)日：2024-09-18

    申请号：EP24159612.1

    申请日：2024-02-26

    申请人： The Boeing Company

    发明人： SAFAI, Morteza

    IPC分类号： G01N23/04 ,  G01T1/20

    CPC分类号： G01N23/04 ,  G01N2223/42320130101 ,  G01N2223/330320130101 ,  G01T1/20181

    摘要： A system for radiographic inspection includes a line source that emits a fan shaped beam of x-rays and a linear x-ray detector that detects the fan shaped beam of x-rays. The system further includes a first movable platform that positions the line source to emit the fan shaped beam of x-rays towards the linear x-ray detector. A second movable platform positions the linear x-ray detector to detect the fan shaped beam of x-rays after transmission through the structure or component being inspected. Synchronized movement of the first movable platform and the second movable platform significantly reduces the time of inspection while the fan shaped beam of x-rays minimizes health risks. The system further includes a first filter that blocks x-rays below a first energy threshold, and a second filter that blocks x-rays below a second energy threshold. The filters provide the system the ability to inspect structures and components formed of multiple types of materials, for example, foreign object debris.

    X-RAY INSPECTION APPARATUS WITH SENSITIVITY CORRECTION UNIT AND CORRESPONDING SENSITIVITY CORRECTION METHOD
    2.
    发明公开
    X-RAY INSPECTION APPARATUS WITH SENSITIVITY CORRECTION UNIT AND CORRESPONDING SENSITIVITY CORRECTION METHOD 审中-实审

    公开(公告)号：EP4435416A1

    公开(公告)日：2024-09-25

    申请号：EP24162467.5

    申请日：2024-03-08

    申请人： Ishida Co., Ltd.

    发明人： YOSHIDA, Keisuke ,  YURUGI, Futoshi ,  HIROSE, Osamu ,  SUGIMOTO, Kazuyuki

    IPC分类号： G01N23/04 ,  G01N23/083 ,  G01N23/087

    CPC分类号： G01N23/04 ,  G01N2223/40120130101 ,  G01N2223/42320130101 ,  G01N2223/42420130101 ,  G01N23/083 ,  G01N23/18 ,  G01N23/087

    摘要： Object
    To provide an X-ray inspection apparatus (1) capable of achieving satisfactory inspection performance and a sensitivity correction method for the X-ray inspection apparatus (1).
    Solution
    An X-ray inspection apparatus (1) includes a conveying unit (5) configured to convey an article (G), an X-ray source configured to irradiate the article (G) being conveyed by the conveying unit (5) with X-rays, a detection unit (7) configured to detect the X-rays by photon counting, a threshold value setting unit (22) configured to set a threshold value for discriminating the X-rays detected by the detection unit (7) into two or more energy regions, an inspection unit (23) configured to inspect the article (G) on the basis of the X-rays transmitted through the article (G), the X-rays being detected by the detection unit (7), and a sensitivity correction unit (27) configured to perform sensitivity correction of the detection unit (7) on the basis of the X-rays not transmitted through the article (G), the X-rays being detected by the detection unit (7), the detection unit (7) discriminates and detects the X-rays into the two or more energy regions by using the threshold value, and the sensitivity correction unit (27) performs the sensitivity correction when the threshold value setting unit (22) changes the threshold value.