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    FOREIGN-MATTER INSPECTION DEVICE AND FOREIGN-MATTER INSPECTION SYSTEM
    5.
    发明公开
    FOREIGN-MATTER INSPECTION DEVICE AND FOREIGN-MATTER INSPECTION SYSTEM 审中-公开

    公开(公告)号：EP3358341A1

    公开(公告)日：2018-08-08

    申请号：EP16851884.3

    申请日：2016-09-30

    Applicant: Ishida Co., Ltd. ,  Nissin Electronics Co., Ltd.

    Inventor： YAEGASHI Takuya ,  TANAKA Ryo

    IPC: G01N23/18 ,  G01N23/04 ,  G01N27/72

    CPC classification number: G01N23/18 ,  G01N23/04 ,  G01N23/083 ,  G01N27/72

    Abstract: A foreign-matter inspection device includes a transporting unit transporting an object to be inspected, an X-ray inspection unit detecting a foreign matter included in the object transported by the transporting unit by using permeability of X-rays, a metal detection unit detecting a foreign matter included in the object transported by the transporting unit by using an interaction between a magnetic field and a metal, a housing accommodating the X-ray inspection unit, the metal detection unit, and at least a part of the transporting unit therein, and a data management unit storing result data of the X-ray inspection unit and result data of the metal detection unit in a storage unit in association with each other.

    MODULSYSTEM FÜR EIN RADIOMETRISCHES MESSGERÄT
    6.
    发明公开
    MODULSYSTEM FÜR EIN RADIOMETRISCHES MESSGERÄT 审中-公开

    公开(公告)号：EP3349047A1

    公开(公告)日：2018-07-18

    申请号：EP17151496.1

    申请日：2017-01-13

    Applicant: Berthold Technologies GmbH & Co. KG

    Inventor： Daibenzeiher, Tobias ,  Freiburger, Ewald

    IPC: G01T1/175 ,  G01F23/288 ,  G01N23/083

    CPC classification number: G01T1/2018 ,  G01F23/288 ,  G01F23/2885 ,  G01N9/36 ,  G01N23/083 ,  G01T1/175 ,  G01T3/06 ,  G01T3/08

    Abstract: Modulsystem für ein radiometrisches Messgerät (1000), aufweisend:
    - ein Basismodul (100), mit
    - einer Sensoranordnung (101), die dazu ausgebildet ist, in Abhängigkeit von Strahlung, die auf die Sensoranordnung (101) trifft, ein Messsignal zu erzeugen,
    - einer Signalauswerteeinheit (102), die mit der Sensoranordnung (101) elektrisch gekoppelt ist und die dazu ausgebildet ist, in Abhängigkeit von dem Messsignal eine Messgröße zu ermitteln,
    - einer Steuergeräte-Schnittstelle (103), wobei das Basismodul (100) mittels der Steuergeräte-Schnittstelle (103) mit mindestens einem Steuergerät (300) zum Datenaustausch koppelbar ist, wobei das Basismodul (100) dazu ausgebildet ist, in einem Basisbetriebszustand ausschließlich über seine Steuergeräte-Schnittstelle (103) mit elektrischer Energie versorgt zu werden, und
    - eine Erweiterungsmodul-Schnittstelle (104), und
    - ein Erweiterungsmodul (200), das von dem Basismodul (100) getrennt ausgebildet ist, mit
    - einer Basismodul-Schnittstelle (201), wobei die Basismodul-Schnittstelle (201) mit der Erweiterungsmodul-Schnittstelle (104) zum Datenaustausch und/oder Energie-austausch und/oder Messsignal-Austausch koppelbar ist,
    - einer Anzahl von Funktionsgruppen (202-207), und
    - einer Energieversorgungs-Schnittstelle (208), die mit einer von dem Basismodul (100) und dem Erweiterungsmodul (200) getrennten Energieversorgungseinheit (400) koppelbar ist, wobei über die Energieversorgungs-Schnittstelle (208) zur Verfügung gestellte Energie zur Energieversorgung des Erweiterungsmoduls (200) dient.

    X-RAY DIFFRACTION DETECTION SYSTEM AND METHOD
    9.
    发明公开
    X-RAY DIFFRACTION DETECTION SYSTEM AND METHOD 审中-公开
    X射线衍射检测系统和方法

    公开(公告)号：EP3182175A1

    公开(公告)日：2017-06-21

    申请号：EP16185335.3

    申请日：2016-08-23

    Applicant: Tsinghua University ,  Nuctech Company Limited

    Inventor： CHEN, Zhiqiang ,  ZHANG, Li ,  YANG DAI, Tianyi ,  ZHAO, Ji ,  JIN, Xin ,  CHANG, Ming

    IPC: G01V5/00 ,  G01N23/20

    CPC classification number: G01N23/046 ,  G01N23/083 ,  G01N23/20083 ,  G01N23/207 ,  G01N2223/045 ,  G01N2223/056 ,  G01N2223/316 ,  G01N2223/643 ,  G01V5/0025 ,  G01V5/005 ,  G21K1/02

    Abstract: The present disclosure relates to a detection system and method. The detection system includes: a distributed radiation source (101) having a plurality of radiation source focus points, which emit rays to irradiate an object under detection, wherein the plurality of radiation source focus points are divided into a certain number of groups; a primary collimator (102) that limits rays of each of the radiation source focus points such that the rays emit into an XRD detection device; the XRD detection device (103) including a plurality of XRD detectors that are divided into the same number of groups as the radiation source focus points, wherein XRD detectors in a same group are arranged to be separated by XRD detectors in other groups, and rays of each of the radiation source focus points are merely received by XRD detectors having the same group number as the group number of the radiation source focus point.

    Abstract translation: 本公开涉及检测系统和方法。 该检测系统包括：具有多个辐射源焦点的分布式辐射源（101），其发射用于照射被检测物体的光线，其中多个辐射源焦点被分成一定数量的组; 主要准直器（102），其限制每个辐射源焦点的射线，使得射线发射到XRD检测装置中; 所述XRD检测装置（103）包括被分成与所述辐射源焦点相同数量的组的多个XRD检测器，其中同一组中的XRD检测器被布置成通过其他组中的XRD检测器分离，并且射线 仅由具有与辐射源焦点的组编号相同的组编号的XRD检测器接收每个辐射源焦点。

    X-RAY IMAGING DEVICE
    10.
    发明公开
    X-RAY IMAGING DEVICE 审中-公开
    X射线成像装置

    公开(公告)号：EP3169239A1

    公开(公告)日：2017-05-24

    申请号：EP15734376.5

    申请日：2015-07-07

    Applicant: Koninklijke Philips N.V.

    Inventor： KOEHLER, Thomas ,  ROESSL, Ewald

    IPC: A61B6/03 ,  A61B6/06

    CPC classification number: A61B6/4035 ,  A61B6/0414 ,  A61B6/06 ,  A61B6/4208 ,  A61B6/4291 ,  A61B6/4429 ,  A61B6/4435 ,  A61B6/484 ,  A61B6/502 ,  A61B6/54 ,  G01N23/083

    Abstract: The invention relates to X-ray imaging. In order to improve flexibility, for example in relation with phase-contrast imaging, the X-ray imaging device (10) comprises an X-ray source arrangement for providing an X-ray beam (11). Further, it is provided at least one grating (13, 14) and a line detector (15) with a plurality of sensor lines, which sensor lines are each provided by a plurality of sensor elements, and which sensor lines are provided for detecting respective portions of the X-ray beam (11) passing the at least one grating during operation. The X-ray imaging device is arranged for moving the line detector (15) and an object (21) to be imaged relative to each other, such that in response to the portions of the X-ray beam a number of interference patterns are detectable at respective different relative positions of the line detector and the object for reconstructing an image of the object (21). The at least one grating (13, 14) comprises at least one first segment (161) and at least one second segment (162) arranged adjacent to each other in a direction perpendicular to the direction of the line detector (15). The X-ray imaging device is arranged for moving the line detector (15) and the at least one grating relative to each other between at least a first relative position and a second relative position, such that in the first relative position, a portion of the X-ray beam (11) during operation passes through the at least one first segment (161), while the at least one second segment (162) is arranged outside said portion of the X-ray beam (11), and that in the second relative position, said portion of the X-ray beam (11) during operation passes through the at least one second segment (162), while the at least one first segment (161) is arranged outside said portion of the X-ray beam (11).

    Abstract translation: 本发明涉及X射线成像。 为了提高灵活性，例如与相位对比成像相关，X射线成像装置（10）包括用于提供X射线束（11）的X射线源装置。 此外，提供具有多个传感器线路的至少一个光栅（13,14）和线路检测器（15），所述传感器线路分别由多个传感器元件提供，并且所述传感器线路被设置用于分别检测 在操作期间X射线束（11）的部分通过至少一个光栅。 X射线成像装置被布置用于相对于彼此移动线检测器（15）和待成像的物体（21），使得响应于X射线束的部分，可检测到多个干涉图案 在线检测器和用于重建物体（21）的图像的物体的相应不同相对位置处。 所述至少一个光栅（13,14）包括在垂直于所述线检测器（15）的方向的方向上彼此相邻布置的至少一个第一段（161）和至少一个第二段（162）。 X射线成像装置被布置用于在至少第一相对位置和第二相对位置之间相对于彼此移动线检测器（15）和至少一个光栅，使得在第一相对位置中， 在操作期间，X射线束（11）穿过至少一个第一段（161），而至少一个第二段（162）布置在X射线束（11）的所述部分的外部，并且在 在所述X射线束（11）的所述部分穿过所述至少一个第二段（162）的同时，所述至少一个第一段（161）布置在所述X射线束（11）的所述部分的外部， （11）。

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