Pattern tracer slowdown circuit
    2.
    发明公开
    Pattern tracer slowdown circuit 失效
    Verlangsamerschaltung一个模式追兵。

    公开(公告)号:EP0155395A2

    公开(公告)日:1985-09-25

    申请号:EP84115732.4

    申请日:1984-12-18

    发明人: Vali, Enn

    IPC分类号: B23Q35/128 G06K11/04

    CPC分类号: B23Q35/128 G06K11/04

    摘要: In a circular scanning pattern tracing system, a dual scanning pattern is provided to detect pattern changes in advance of the system steering axis. Pattern detection pulses from both the scanning patterns are adjustable in length and the overlap of the pulses is used to determine whether the system should slow down.

    Line tracer accuracy control
    3.
    发明公开
    Line tracer accuracy control 失效
    线追踪器精度控制

    公开(公告)号:EP0155394A3

    公开(公告)日:1987-10-28

    申请号:EP84115731

    申请日:1984-12-18

    发明人: Vali, Enn

    IPC分类号: B23Q35/128 G06K11/04

    CPC分类号: G06K11/04 B23Q35/128

    摘要: In a circular scanning pattern tracing system having a sample and hold circuit, the width of the sample pulse is - made adjustable. This variable width is equivalent to a variable low pass filter in the system. The effective cut off frequency of the filter is made dependent on the system tangential tracing velocity.

    Line tracer accuracy control
    4.
    发明公开
    Line tracer accuracy control 失效
    精密控制线追兵。

    公开(公告)号:EP0155394A2

    公开(公告)日:1985-09-25

    申请号:EP84115731.6

    申请日:1984-12-18

    发明人: Vali, Enn

    IPC分类号: B23Q35/128 G06K11/04

    CPC分类号: G06K11/04 B23Q35/128

    摘要: In a circular scanning pattern tracing system having a sample and hold circuit, the width of the sample pulse is - made adjustable. This variable width is equivalent to a variable low pass filter in the system. The effective cut off frequency of the filter is made dependent on the system tangential tracing velocity.

    Pattern tracer slowdown circuit
    6.
    发明公开
    Pattern tracer slowdown circuit 失效
    图案追踪器缓存电路

    公开(公告)号:EP0155395A3

    公开(公告)日:1987-10-28

    申请号:EP84115732

    申请日:1984-12-18

    发明人: Vali, Enn

    IPC分类号: B23Q35/128 G06K11/04

    CPC分类号: B23Q35/128 G06K11/04

    摘要: In a circular scanning pattern tracing system, a dual scanning pattern is provided to detect pattern changes in advance of the system steering axis. Pattern detection pulses from both the scanning patterns are adjustable in length and the overlap of the pulses is used to determine whether the system should slow down.