ADDITIVE MANUFACTURING LAYER DEFECT IDENTIFICATION AND ANALYSIS USING MASK TEMPLATE

    公开(公告)号:EP4421733A1

    公开(公告)日:2024-08-28

    申请号:EP24159883.8

    申请日:2024-02-27

    Abstract: A quality of a formed layer of a build structure being fabricated by an additive manufacturing machine is assessed. A digital image is obtained of a portion of the formed layer of the build structure within a build layer. First region image data including data corresponding to a first region of the formed layer is separated, via a computer processor, from second region image data including data corresponding to one of or both a second region of the formed layer or a first region of the build layer outside of the formed layer based on a layer image template. A subset of image intensity data corresponding to a subset of the first region image data is analyzed, via the computer processor, to determine a characteristic value based on the analysis. An alert is sent, via the computer processor, when the characteristic value deviates from a preset range.

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